Publication details

 

High resolution SEM of carbon micro - and nanostructures prepared in microwave discharge

Basic information
Original title:High resolution SEM of carbon micro - and nanostructures prepared in microwave discharge
Authors:Jiřina Matějková, Marek Eliáš, Ondřej Jašek, Zdeněk Frgala, Martin Bublan, Lenka Zajíčková, Antonín Rek
Further information
Citation:MATĚJKOVÁ, Jiřina, Marek ELIÁŠ, Ondřej JAŠEK, Zdeněk FRGALA, Martin BUBLAN, Lenka ZAJÍČKOVÁ a Antonín REK. High resolution SEM of carbon micro - and nanostructures prepared in microwave discharge. In Proceedings of International conference NANO'05. 1. vyd. Brno: ČSNMT Praha, 2005. s. 107-108, 2 s. ISBN 80-214 304.Export BibTeX
@inproceedings{602524,
author = {Matějková, Jiřina and Eliáš, Marek and Jašek, Ondřej and Frgala, Zdeněk and Bublan, Martin and Zajíčková, Lenka and Rek, Antonín},
address = {Brno},
booktitle = {Proceedings of International conference NANO'05},
edition = {1},
keywords = {scanning electron microscopy; carbon microstructures;carbon nanostructures; microwave discharge},
language = {eng},
location = {Brno},
isbn = {80-214 304},
pages = {107-108},
publisher = {ČSNMT Praha},
title = {High resolution SEM of carbon micro - and nanostructures prepared in microwave discharge},
year = {2005}
}
Original language:English
Field:Plasma physics
Type:Article in Proceedings
Keywords:scanning electron microscopy; carbon microstructures;carbon nanostructures; microwave discharge

Two different carbon structures, carbon nanotubes (CNTs) and crystalline diamond films, were studied by a high resolution scanning electron microscope (SEM). Both forms of carbon were prepared by plasma enhanced chemical vapor deposition (PECVD) in microwave discharges.SEM observation of nanotubes were made by the high performance field emission SEM using SEI mode electron images. No charging effects were observed.

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