Publication details
Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges
| Basic information | |
|---|---|
| Original title: | Optical and mechanical characterization of ultrananocrystalline diamond films prepared in dual frequency discharges |
| Authors: | Monika Karásková, Lenka Zajíčková, Vilma Buršíková, Daniel Franta, David Nečas, Olga Bláhová, Jiří Šperka |
| Further information | |
|---|---|
| Citation: | KARÁSKOVÁ, Monika, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Daniel
FRANTA, David NEČAS, Olga BLÁHOVÁ and Jiří ŠPERKA. Optical and
mechanical characterization of ultrananocrystalline diamond
films prepared in dual frequency discharges. Surface &
coatings technology, Elsevier Science, 2010, vol. 204, 12 -13,
p. 1997–2001. ISSN 0257 -8972.Export BibTeX |
| Original language: | English |
| Field: | Plasma physics |
| Type: | Article in Periodical |
| Keywords: | ultrananocrystalline diamond; bias enhanced nucleation; indentation hardness; ellipsometry; FTIR |
Ultrananocrystalline diamond (UNCD) films were deposited directly on polished c-Si substrates in microwave discharge (2.45 GHz) combined with rf capacitive plasma (13.56 MHz) ignited at the substrate electrode. The rf discharge induced a dc self-bias accelerating ions towards the growing film during the whole deposition process. The substrate was either preheated in hydrogen discharge to the deposition temperature of 900 C or the deposition of intermediate layer started at about 200 C and reached 900 C in the 5th minute. The latter procedure resulted in the deposition of coating with the hardness of 70 GPa and very good fracture toughness. The analysis of optical measurement in UV-IR range confirmed the presence of 250 nm thick intermediate layer containing DLC and SiC materials.
Related projects:
- Study and application of plasma chemical reactions in non-isothermic low temperature plasma and its interaction with solid surface
- Deposition of thermomehanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges
- Nanometrologie využívající metod rastrovací sondové mikroskopie












