Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices

• Authors: HOLÝ Václav; MEDUŇA Mojmír; ROCH Tomáš; BAUER Guenther
• Year of publication: 2002
• Type: Article in Periodical
• Magazine / Source: Semicond. Sci. Technol.
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
• Description: Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices

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