Atomic force microscopy characterization of ZnTe epitaxial thin films

• Authors: KLAPETEK Petr; OHLÍDAL Ivan; MONTAIGNE-RAMIL Alberto; BONANNI Alberta; STIFTER David; SITTER Helmut
• Year of publication: 2003
• Type: Article in Periodical
• Magazine / Source: Japanese Journal of Applied Physics
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: ZnTe epitaxial films; AFM analysis; faceted boundaries
• Description: In this paper, results concerning atomic force microscopy studies of the upper bounaries of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is sohw that the upper boundaries exhibit faceted structure which is described by means of statistical analysis.

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