Publication details
X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices
| Authors | |
|---|---|
| Year of publication | 2004 |
| Type | Article in Periodical |
| Magazine / Source | Journal of Applied Physics |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | Lateral composition modulation; short-period superlattices; x-ray scattering |
| Description | Lateral composition modulation in InAs/AlAs short-period superlattices was investigated by x-ray grazing-incidence diffraction and coplanar x-ray diffraction at a "normal" wavelength and at an anomalous wavelength, for which diffraction from the (200) planes does not exhibit a chemical contrast. The experimental data were compared with theoretical simulations assuming that the interfaces consist of a periodic sequence of monoatomic steps. |
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