X-Ray Reflectivity measurements to evaluate thin films and multilayers thickness: preliminary results of the first world Round-Robin Test

• Authors: AGNIHOTRI Dileepa; ASADCHIKOV V. E.; BONTEMPI Elza; CHANG Chang-Hwan; COLOMBI Paolo; DEPERO Laura E.; FARNWORTH Mark; FUJIMOTO Toshiyuki; GIBAUD Alan; JERGEL Matej; BOWEN D. Keith; KRUMREY Michael; LAMPERTI Alessio; LAFFORD Tamzin A.; MATYI Richard J; MA T.; MEDUŇA Mojmír; MILITA Silvia; SAKURAI Kenji; SHABEL'NIKOV Leonid; SONI S.; ULYANENKOV Alexander; LEE A. van der; WIEMER Claudia
• Year of publication: 2006
• Type: Article in Proceedings
• Conference: XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism
• Keywords: standartization; x-ray reflectivity
• Description: A round-robin involving 20 laboratories was started in September 2005 to assess the reproducibility of the spectra and errors in the calculated sample thickness of several specimens of GaAs/GaAl multilayers. Preliminary results were presented and discussed.

Related projects

• Investigation of morphology of semiconductor multilayers using x-ray scattering
• Physical and chemical properties of advanced materials and structures