Spectroscopic ellipsometry of few-layer graphene

• Authors: ISIC Goran; JAKOVLJEVIC Milka; FILIPOVIC Marko; JOVANOVIC Djordje; VASIC Borislav; LAZOVIC Sasa; PUAC Nevena; PETROVIC Zoran; KOSTIC Radmila; GAJIC Rados; HUMLÍČEK Josef; LOSURDO Maria; BRUNO Giovanni; BERGMAIR Iris; HINGERLT Kurt
• Year of publication: 2011
• Type: Article in Periodical
• Magazine / Source: Journal of Nanophotonics
• MU Faculty or unit: Faculty of Science
• Doi: http://dx.doi.org/10.1117/1.3598162
• Field: Solid matter physics and magnetism
• Keywords: graphene; ellipsometry; island film model
• Description: The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%.

Related projects

• Physical and chemical properties of advanced materials and structures