Assoc. Prof. RNDr. Petr Mikulík, Ph.D.
OBERTA, P. - HRDÝ, J. - MIKULÍK, Petr.
A proof-of-principle experiment of a novel harmonics separation optics for synchrotron facilities. Journal of Synchrotron Radiation, Hoboken, USA, WILEY-BLACKWELL PUBLISHING, USA. ISSN 0909-0495, 2012, vol. 19, no. 6, pp. 1012-1014.
FIALOVÁ, Dana - DROZDOVÁ, Eva - SKOUPÝ, Radim - MIKULÍK, Petr - KLÍMA, Bohuslav.
Oral bacterial flora studied in old Slavonic populations from 9th century using analysis of dental calculus. 2012.
HRDÝ, J. - MIKULÍK, Petr - OBERTA, P..
Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation. Journal of Synchrotron Radiation, USA. ISSN 0909-0495, 2011, vol. 18, no. 1, pp. 299-301.
VAGOVIČ, P. - KORYTÁR, D. - MIKULÍK, Petr - CECILIA, A. - FERRARI, C. - YANG, Y. - HANSCHKE, D. - HAMANN, E. - PELLICCIA, D. - LAFFORD, T.A. - FIEDERLE, M. - BAUMBACH, T..
In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation, USA. ISSN 0909-0495, 2011, vol. 18, no. 1, pp. 753-760.
HELFEN, L. - MYAGOTIN, A. - MIKULÍK, Petr - PERNOT, P. - VOROPAEV, A. - ELYYAN, M. - DI MICHIEL, M. - BARUCHEL, J. - BAUMBACH, T..
On the implementation of computed laminography using synchrotron radiation. Review of Scientific Instruments, Melville (USA), American Institute of Physics, USA. ISSN 0034-6748, 2011, vol. 82, no. 1, "nestrankovano"-8 pp.
OBERTA, P. - MIKULÍK, Petr - KITTLER, M. - HRDÝ, J..
X-ray collimation by crystals with precise parabolic holes based on diffractive-refractive optics. Journal of Synchrotron Radiation, USA. ISSN 0909-0495, 2011, vol. 18, no. 1, pp. 522-526.
FERRARI, C. - GERMINI, F. - KORYTÁR, D. - MIKULÍK, Petr - PEVERINI, L..
X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography, Great Britain. ISSN 0021-8898, 2011, vol. 44, no. 44, pp. 353-358.
KORYTÁR, D. - FERRARI, C. - MIKULÍK, Petr - DOBROČKA, E. - ÁČ, V. - KONOPKA;, P. - ERKO, A. - ABROSIMOV, N. - ZÁPRAŽNÝ, Z..
1D X-ray Beam Compressing Monochromators. In 20th International Congress on X-Ray Optics and Microanalysis: AIP Conference Proceedings. New York : American Institute of Physics, 2010. ISBN 978-0-7354-0764-0, pp. 59-62. 2009, Karlsruhe.
OBERTA, P. - MIKULÍK, Petr - KITTLER, M. - HRDÝ, J. - PEVERINI, L..
Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces. Journal of Synchrotron Radiation, USA. ISSN 0909-0495, 2010, vol. 17, no. 1, pp. 36-40.
OBERTA, P. - MIKULÍK, Petr - HRDÝ, J. - KITTLER, M..
Highly asymmetric Laue focusing monochromator. In SRI 2009: The 10th international conference on synchrotron radiation instrumentation: AIP Conference Proceedings. New York : American Institute of Physics, 2010. ISBN 978-0-7354-0782-4, 724–727-4 pp. 2009, Melbourne.
KORYTÁR, D. - FERRARI, C. - MIKULÍK, Petr - VAGOVIČ, P. - DOBROČKA, E. - ÁČ, V. - KONOPKA, P. - ERKO, A. - ABROSIMOV, N..
Linearly graded GeSi beam-expanding/compressing X-ray monochromator. Journal of Applied Crystallography, Great Britain. ISSN 0021-8898, 2010, vol. 2010, no. 43, pp. 176-178.
ČECH, V. - LICHOVNÍKOVÁ, S. - TRIVEDI, R. - PEŘINA, V. - ZEMEK, J. - MIKULÍK, Petr - CAHA, Ondřej.
Plasma polymer films of tetravinylsilane modified by UV irradiation. Surface and Coatings Technology, Switzerland. ISSN 0257-8972, 2010, vol. 205, no. 1, S177–S181-5 pp.
HOVORKA, Miloš - MIKA, Filip - MIKULÍK, Petr - FRANK, Luděk.
Profiling N-Type Dopants in Silicon. Materials Transactions, Japan. ISSN 1345-9678, 2010, vol. 51, no. 2, pp. 237-242.
CAHA, Ondřej - MEDUŇA, Mojmír - BERNATOVÁ, Silvie - RŮŽIČKA, Jiří - MIKULÍK, Petr - BURŠÍK, Jiří - SVOBODA, Milan - BERNSTORFF, S..
X-ray scattering study of oxide precipitates in Cz-Si. 2010. ISBN 978-80-254-7361-0.
HUBER, I. - MIKULÍK, Petr - BAUMBACH, T..
Correctness of a particular solution of inverse problem in rocking curve imaging. physica status solidi (a), Wiley, Germany. ISSN 1862-6300, 2009, vol. 208, no. 8, pp. 1860-1864.
NEČAS, David - ZAJÍČKOVÁ, Lenka - FRANTA, Daniel - SŤAHEL, Pavel - MIKULÍK, Petr - MEDUŇA, Mojmír - VALTR, Miroslav.
Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology, Tokyo, The Surface Science Society of Japan, Japan. ISSN 1348-0391, 2009, vol. 7, no. březen, pp. 486-490.
MIKULÍK, Petr - POKORNÁ, Zuzana - RŮŽIČKA, Bohdan - KOZUBEK, Stanislav.
Projekt Středoevropské synchrotronové laboratoře - CESLAB. Československý časopis pro fyziku, Praha, Fyzikální ústav AV ČR. ISSN 0009-0700, 2009, vol. 58, no. 5, 9 pp.
BAUMBACH, Tilo - MIKULÍK, Petr.
X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin : Springer, 2009. Lecture Notes in Physics: 770, ISBN 978-3-540-88587-0, pp. 235-288.
KULHA, P. - BOURA, A. - HUSÁK, M. - MIKULÍK, Petr - KUČERA, Milan - VALENDA, Stanislav.
Design and Fabrication of High-Temperature SOI Strain-Gauges. In 7th International Conference on Advanced Semiconductor Devices and Microsystems. New York : IEEE, 2008. ISBN 978-1-4244-2325-5, pp. 175-178. 2008, Smolenice.
HOLÝ, Václav - BAUMBACH, T. - LÜBBERT, D. - HELFEN, L. - ELLYAN, M. - MIKULÍK, Petr - KELLER, S. - DENBAARS, S.P. - SPECK, J..
Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B, USA, The American Physical Society, USA. ISSN 1098-0121, 2008, vol. 77, no. 1, pp. 94102-94110.
KORYTÁR, D. - FERRARI, C. - MIKULÍK, Petr - GERMINI, F. - VAGOVIČ, P. - BAUMBACH, T..
High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors. In Modern Developments in X-Ray and Neutron Optics. Berlin : Springer, 2008. Springer Series in Optical Sciences 137, ISBN 978-3-540-74560-0, pp. 501-512.
LÜBBERT, D. - BAUMBACH, T. - HOLÝ, Václav - MIKULÍK, Petr - HELFEN, L. - PERNOT, P. - ELLYAN, M. - KELLER, S. - KATONA, T.M. - DENBAARS, S.P. - SPECK, J..
Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters, Paríž, European Physical Society, Great Britain. ISSN 0295-5075, 2008, vol. 82, no. 5, pp. 56002-56006.
CAHA, Ondřej - KUBĚNA, Josef - KUBĚNA, Alan - MEDUŇA, Mojmír - MIKULÍK, Petr.
Study of oxygen precipitates in silicon using Bragg and Laue x-ray diffraction. 2008.
ÁČ, V. - PERICHTA, P. - KORYTÁR, D. - MIKULÍK, Petr.
Thermal effects under synchrotron radiation power absorption. In Modern Developments in X-Ray and Neutron Optics. Berlín : Springer, 2008. Springer Series in Optical Sciences 137, ISBN 978-3-540-74560-0, pp. 513-524.
MIKULÍK, Petr.
Central European Synchrotron Laboratory (CESLAB): Conceptual Design and the Proposed Beamlines. Brno : Synchrotron Facilities for the Development of Science and Technology in Central and Eastern Europe, 2007. international conference.
KUBĚNA, Josef - KUBĚNA, Alan - CAHA, Ondřej - MIKULÍK, Petr.
Development of oxide precipitates in silicon: calculation of the distribution function of the classical theory of nucleation by a nodal-points approximation. J. Phys. Condens. Matter, IOP Publishing Ltd, Great Britain. ISSN 0953-8984, 2007, vol. 19, no. 49, pp. 496202-496212.
MIKULÍK, Petr.
Laboratoř polovodičů - čisté prostory pro křemíkovou technologii na MU. Tatranská Štrba (Slovensko) : DMS-RE, 2007. international workshop.
VAGOVIČ, P. - KORYTÁR, D. - MIKULÍK, Petr - FERRARI, C..
On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instruments and Methods in Physics Research Section B, ELSEVIER (NORTH-HOLLAND), The Nederlands. ISSN 0168-583X, 2007, vol. 265, no. 2, pp. 599-604.
HELFEN, L. - MYAGOTIN, A. - RACK, A. - PERNOT, P. - MIKULÍK, Petr - DIMICHIEL, M. - BAUMBACH, T..
Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices. Physica stat.sol.(a), The Nederlands. ISSN 0031-8965, 2007, vol. 204, no. 8, pp. 2760-2765.
MIKULÍK, Petr.
X-ray reflectometry and diffuse scattering. Vyd. 2007. Smolenice (Slovensko) : 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.
MIKULÍK, Petr - LÜBBERT, D. - PERNOT, P. - HELFEN, L. - BAUMBACH, T..
Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science, USA, ELSEVIER (NORTH-HOLLAND), USA. ISSN 0169-4332, 2006, vol. 253, no. 1, pp. 188-193.
HELFEN, L. - MYAGOTIN, A. - PERNOT, P. - DIMICHIEL, M. - MIKULÍK, Petr - BERTHOLD, A. - BAUMBACH, T..
Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging. Nuclear Instruments & Methods in Physics Research A, USA. ISSN 0168-9002, 2006, vol. 563, no. 1, pp. 163-166.
HELFEN, L. - BAUMBACH, T. - KIEL, D. - PERNOT, P. - MIKULÍK, Petr - CLOETENS, P. - BARUCHEL, J..
Three-dimensional Imaging by Synchrotron Radiation Computed Laminography. ESRF Highlights 2005, Francie, ESRF, France. 2006, vol. 2006, no. 1, pp. 107-108.
LÜBBERT, D. - MIKULÍK, Petr - PERNOT, P. - HELFEN, L. - CRAVEN, M.D. - KELLER, S. - DENBAARS, S. - BAUMBACH, T..
X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a), The Nederlands. ISSN 0031-8965, 2006, vol. 203, no. 7, pp. 1733-1738.
HRDÝ, J. - KUBĚNA, Alan - MIKULÍK, Petr.
Aberrations of diffractive-refractive optics: Bragg-case sagittal focusing of multiple parabolic elements. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2005, vol. 38, no. 24, pp. 4325-4328.
LÜBBERT, D. - FERRARI, C. - MIKULÍK, Petr - PERNOT, P. - HELFEN, L. - VERDI, N. - KORYTÁR, D. - BAUMBACH, T..
Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography, Velká Britanie, Int. Union of Crystallography, Great Britain. ISSN 0021-8898, 2005, vol. 38, no. 1, pp. 91-96.
HELFEN, L. - BAUMBACH, T. - MIKULÍK, Petr - KIEL, D. - PERNOT, P. - CLOETENS, P. - BARUCHEL, J..
High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography. Applied Physics Letters, USA, American Institute of Physics, USA. ISSN 0003-6951, 2005, vol. 86, no. 1, pp. 071915-1.
CAHA, Ondřej - MIKULÍK, Petr - NOVÁK, Jiří - HOLÝ, Václav - MOSS, Simon C..
Investigation of the spontaneous lateral composition modulation in InAs/AlAs short-period superlattices by grazing-incidence x-ray diffraction. Materials Structure in Chemistry, Biology, Physics and Technology, Czech Republic, Czech and Slovak Crystalographic Associa. ISSN 1211-5894, 2005, vol. 12, no. 2, p. 137-138.
LÜBBERT, D. - BAUMBACH, T. - MIKULÍK, Petr - PERNOT, P. - HELFEN, L. - KÖHLER, R. - KATONA, T.M. - KELLER, S. - KATONA, T.M. - DENBAARS, S.P..
Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging. Journal of physics D: Applied physics, Bristol, England, IOP Publishing Ltd., Great Britain. ISSN 0022-3727, 2005, vol. 38, no. 10A, pp. A50-A5.
KORYTÁR, D. - BAUMBACH, T. - FERRARI, C. - HELFEN, L. - VERDI, N. - MIKULÍK, Petr - KUBĚNA, Alan - VAGOVIČ, P..
Monolithic two-dimensional beam compressor for hard x-ray beams. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2005, vol. 38, no. 1, pp. A208-A212.
CAHA, Ondřej - MIKULÍK, Petr - NOVÁK, Jiří - HOLÝ, Václav - MOSS, Simon C. - NORMAN, Andrew.
Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction. Physical Review B, USA, American Physical Society, USA. ISSN 1098-0121, 2005, vol. 72, no. 3, pp. 35313-35322.
HELFEN, L. - DEHN, F. - MIKULÍK, Petr - BAUMBACH, T..
Three-dimensional imaging of cement microstructure evolution during hydration
Three-dimensional imaging of cement microstructure evolution during hydration. Advances in Cement Research, London, Great Britain. ISSN 0951-7197, 2005, vol. 17, no. 3, pp. 103-111.
KÖHLER, B. - SCHREIBER, J. - BENDJUS, B. - HERMS, M. - MELOV, V. - HELFEN, L. - MIKULÍK, Petr - BAUMBACH, T..
Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance. Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II, USA, SPIE, USA. ISSN 0-8194-5309-9, 2004, vol. 5392, no. 1, pp. 63-77.
MIKULÍK, Petr.
Project of a clean room laboratory for silicon device technology at the Masaryk University. In Proceedings of International Conference Silicon-2004. Rožnov pod Radhoštěm : Karel Vojtěchovský, 2004. pp. 54-55. 2004, Rožnov pod Radhoštěm.
BAUMBACH, T. - HELFEN, L. - MIKULÍK, Petr - DEHN, F..
Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno : Sdružení pro sanace betonových konstrukcí, 2004. pp. 71-80. 2004, Brno.
FERRARI, C. - VERDI, N. - LÜBBERT, D. - KORYTÁR, D. - MIKULÍK, Petr - BAUMBACH, T. - HELFEN, L. - PERNOT, P..
Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique. Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics, USA, SPIE, USA. ISSN 0-8194-5068-5, 2003, vol. 5195, no. 1, pp. 84-93.
MIKULÍK, Petr - LÜBBERT, D. - KORYTÁR, D. - PERNOT, P. - BAUMBACH, T..
Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2003, vol. 36, no. 1, pp. A74-A78.
KORYTÁR, D. - MIKULÍK, Petr - FERRARI, C. - HRDÝ, J. - BAUMBACH, T. - FREUND, A. - KUBĚNA, Alan.
Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2003, vol. 36, no. 1, pp. A65-A68.
MIKULÍK, Petr - BAUMBACH, T. - KORYTÁR, D. - PERNOT, P. - LÜBBERT, D. - HELFEN, L. - LANDESBERGER, Ch..
Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure, Praha, The Czech and Slovak Cryst. Assoc. ISSN 1211-5894, 2002, vol. 9, no. 2, pp. 87-88.
KAGANER, V.M. - JENICHEN, B. - PARIS, G. - PLOOG, K.H. - KONOVALOV, O. - MIKULÍK, Petr - ARAI, S..
Strain in buried quantum wires: Analytical calculations and x-ray diffraction study. Phys. Rev. B, USA, The American Phys. Society, USA. ISSN 0163-1829, 2002, vol. 2002, no. 66, pp. 35310-35316.
MIKULÍK, Petr - JERGEL, M. - BAUMBACH, T. - MAJKOVÁ, E. - PINČÍK, E. - LUBY, Š. - ORTEGA, L. - TUCOULOU, R. - HUDEK, P. - KOSTIČ, I..
Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2001, vol. 34, no. 10A, A188-5 pp.
ULYANENKOV, A. - INABA, K. - MIKULÍK, Petr - DAROWSKI, N. - OMOTE, K. - GRENZER, J. - FORCHEL, A..
X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 2001, vol. 34, no. 10A, A179-4 pp.
JERGEL, M. - FALCONY, C. - MIKULÍK, Petr - ORTEGA, L. - MAJKOVÁ, E. - PINČÍK, E. - LUBY, Š. - KOSTIČ, I. - HUDEK, P..
X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío, Mexico, Sociedad Mexicana de Ciencia de Superfic, Mexico. ISSN 1665-3521, 2001, vol. 2001, no. 13, pp. 10-14.
JERGEL, M. - MIKULÍK, Petr - MAJKOVÁ, E. - PINČÍK, E. - LUBY, Š. - BRUNEL, M. - HUDEK, P. - KOSTIČ, I..
Multilayer gratings for X-UV optics. Acta physica slovaca, Bratislava, Institute of Physics, SAS, Slovakia. ISSN 0323-0465, 2000, vol. 50, no. 4, pp. 427-864.
SPRINGHOLZ, G. - STANGL, J. - PINCZOLITS, M. - HOLÝ, Václav - MIKULÍK, Petr - MAYER, P. - WIESAUER, K. - BAUER, G. - SMILGIES, D. - KANG, H.H. - SALAMANCA-RIBA, L..
Nearly perfect 3D ordering in IV-VI quantum dot superlattices with ABCABC.. vertical stacking sequence. Physica E, Amsterdam, The Nederlands. ISSN 1386-9477, 2000, vol. 2000, no. 7, pp. 870-875.
STANGL, J. - HOLÝ, Václav - DARHUBER, A.A. - MIKULÍK, Petr - BAUER, G. - ZHU, J. - BRUNNER, K. - ABSTREITER, G..
High-resolution x-ray diffraction on self-organized step bunches of Si<sub>1-x</sub>Ge<sub>x</sub> grown on (113)-oriented Si. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing LTd, Great Britain. ISSN 0022-3727, 1999, vol. 32, no. 9999, A71-4 pp.
STANGL, J. - HOLÝ, Václav - MIKULÍK, Petr - BAUER, G. - KEGEL, I. - METZGER, T.H. - SCHMIDT, O.G. - LANGE, C. - EBERL, K..
Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters, USA, American Institute of Physics, USA. ISSN 0003-6951, 1999, vol. 74, no. -, pp. 3785-3787.
ZHUANG, Y. - HOLÝ, Václav - STANGL, J. - DARHUBER, A.A. - MIKULÍK, Petr - ZERLAUTH, S. - SCHÄFFLER, F. - BAUER, G. - DAROWSKI, N. - LÜBBERT, D. - PIETSCH, U..
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 1999, vol. 32, no. 9999, A224-6 pp.
JERGEL, M. - MIKULÍK, Petr - MAJKOVÁ, E. - LUBY, Š. - SENDERÁK, R. - PINČÍK, E. - BRUNEL, M. - HUDEK, P. - KOSTIČ, I. - KONEČNÍKOVÁ, A..
Structural characterization of a lamellar W/Si multilayer grating. J. Appl. Phys., USA, American Institute of Physics, USA. ISSN 0021-8979, 1999, vol. 85, no. 2, pp. 1225-1227.
JERGEL, M. - MIKULÍK, Petr - MAJKOVÁ, E. - LUBY, Š. - SENDERÁK, R. - PINČÍK, E. - BRUNEL, M. - KOSTIČ, I. - KONEČNÍKOVÁ, A..
Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys., Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0022-3727, 1999, vol. 32, no. 9999, A220-4 pp.
LITZMAN, Otto - MIKULÍK, Petr.
The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J.Phys.: Condens. Matter, Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0953-8984, 1999, vol. 11, no. 9999, pp. 5767-5779.
LITZMAN, Otto - MIKULÍK, Petr.
The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter, IOP Publishing Ltd, Great Britain. ISSN 0953-8984, 1999, vol. 11, no. 30, pp. 5767-5779.
ZHUANG, Y. - STANGL, J. - DARHUBER, A.A. - BAUER, G. - MIKULÍK, Petr - HOLÝ, Václav - DAROWSKI, N, - PIETSCH, U..
X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics, Great Britain, Kluwer Academic Publishers, USA. ISSN 0957-4522, 1999, vol. (10)1999, no. -, pp. 215-221.
MIKULÍK, Petr - BAUMBACH, T..
X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B, USA, The American Phys. Society, USA. ISSN 0163-1829, 1999, vol. 59, no. 11, pp. 7632-7643.
BAUMBACH, Tilo - MIKULÍK, Petr.
X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin : Springer, 1999. Lecture Notes in Physics: 58, pp. 232-280.
DARHUBER, A.A. - HOLÝ, Václav - STANGL, J. - MIKULÍK, Petr - BRUNNER, K. - ABSTREITER, G. - BAUER, G..
Highly regular self-organization of step bunches during growth of SiGe on Si(113). Appl. Phys. Lett., USA, Institute of Physics, USA. ISSN 0003-6951, 1998, vol. 73(1998), no. -, pp. 1535-1537.
MIKULÍK, Petr - BAUMBACH, Tilo.
X-ray reflection by multilayer surface gratings. Physica B condensed matter, Amsterdam, The Nederlands. ISSN 0921-4526, 1998, vol. 248, no. 9999, pp. 381-386.
MIKULÍK, Petr.
X-ray reflectivity from planar and structured multilayers : Réflectivité des rayons X par des milticouches planaires et structurées (Souběž.) : Rentgenová reflektivita rovinných a strukturovaných multivrstev (Souběž.). 1997. 151 pp. Doktorandská práce--Masarykova univerzita Brno, Přírodovědecká fakulta, 1997. r99.
DUB, Petr - LITZMAN, Otto - MIKULÍK, Petr.
Dynamical theory of diffraction of particles: Ewald approach. I. In Dynamical theory of diffraction of particles: Ewald approach. Brno : Masarykova univerzita Brno, 1996. physics, 24-26, ISBN 80-210-1482-2, pp. 5-38.
DUB, Petr - LITZMAN, Otto - MIKULÍK, Petr.
Dynamical theory of diffraction of particles: Ewald's approach. I. Scripta Fac. Sci. Nat. Univ. Purk. Brun. ISSN 8021009640, 1996, vol. 1996, no. 26, pp. 5-38.
LITZMAN, Otto - MIKULÍK, Petr - DUB, Petr.
Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept. J.Phys.: Condens. Matter, Velká Britanie, IOP Publishing Ltd, Great Britain. ISSN 0953-8984, 1996, vol. 8, no. 9999, pp. 4709-4725.
LITZMAN, Otto - MIKULÍK, Petr - DUB, Petr.
Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept. J.Phys: Conds Matter, Great Britain. ISSN 0953-8984, 1996, vol. 8, no. 1, p. 4709-4709.
HOLÝ, Václav - MIKULÍK, Petr.
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Epitaxial growth and characterization of Y<sub>2</sub>Co<sub>17</sub>(0001) thin films deposited on W(110). J. Appl. Phys., USA, American Institute of Physics, USA. ISSN 0021-8979, 1995, vol. 78, pp. 997-1003.
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X-ray diffraction on Fibonacci superlattices. Acta Crystallographica A, Great Britain. 1995, vol. 51, no. 9999, pp. 825-830.
