Ing. Pavel Franta
Technician, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3709 |
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E‑mail: |
Total number of publications: 10
2023
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Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model
Coatings, year: 2023, volume: 13, edition: 2, DOI
2022
2021
2020
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Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm.
Year: 2020
2019
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Optical properties of the crystalline silicon wafers described using the universal dispersion model
Journal of Vacuum Science & Technology B, year: 2019, volume: 37, edition: 6, DOI
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Temperature dependent dispersion models applicable in solid state physics
Journal of Electrical Engineering, year: 2019, volume: 70, edition: 7, DOI
2018
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Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
Journal of Applied Physics, year: 2018, volume: 123, edition: 18, DOI
2017
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Temperature-dependent dispersion model of float zone crystalline silicon
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
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Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI