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prof. RNDr. Josef Humlíček, CSc.

Professor, Department of Condensed Matter Physics

Office: pav. 09/02014
Kotlářská 267/2
611 37 Brno

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Phone: +420 549 49 4505
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Basic information
CV

Curriculum vitae

Person Identification
  • Prof. RNDr. Josef Humlicek, CSc. born November 28, 1947, in Ostrov nad Oslavou; married, 2 children
Workplace
  • Faculty of Science Institute of Condensed Matter Physics Kotlarska 2 CZ-611 37 Brno Czech Republic
Employment Position
  • Professor, Institute of Condensed Matter Physics
Education and Academic Qualifications
  • 1965-1970: study of physics, Faculty of Science, Purkyne Univ. Brno
  • 1973: RNDr. degree, thesis on Electroreflectance of Germanium
  • 1975: CSc. degree, thesis on Modulation Spectroscopy of Ge
  • 1990: habilitation, dissertation on Analysis of Spectrum Line Profiles
  • 1994: professor appointment - solid state physics, Masaryk University
Employment Summary
  • 1971/72: research stay at Institute of Physical Metallurgy, Brno
  • 1972-75: doctoral student of physics at Faculty of Science, Purkyne University, Brno
  • 1976-90: various research positions at Faculty of Science, Purkyne University, Brno
  • 1991-93: associated professor and head of department, Faculty of Science, Masaryk University, Brno
  • 1994-2015: professor and head of department, Faculty of Science, Masaryk University, Brno
  • 2011-: Research group leader, CEITEC
  • 2011-: Leader of the Center of nano- and microtechnologies, CEITEC MU
Pedagogical Activities
  • Thermodynamics, Statistical physics, Physical properties of materials, Optical properties of solids, Physics of quantum wells and superlattices, Advanced numerical methods, Mathematical methods of data analysis, Modern experimental methods, Panorama of Physics. Condensed matter physics II.
Scientific and Research Activities
  • Solid state physics, optical spectroscopy.
Academical Stays
  • 1987/88: Max-Planck Institute (MPI) FKF Stuttgart, 10 months
  • 1990/91: MPI Stuttgart, 10 months
  • 1992, 1993, 1995, 1996, 1998, 1998, 2000, 2001, 2003, 2004: MPI Stuttgart, 1-2 months on average
  • 1997: Iowa State University, Ames, 2 months 2013: Kyung Hee University Seoul, 1 month
University Activities
  • Since 1991: Head of department, Faculty of Science, Masaryk Uiversity Brno
  • Since 1991: Member of the Scientific Council of the Faculty of Science, Masaryk Uiversity Brno
  • 1995-2015: Member of the Scientific Council of Masaryk Uiversity Brno
Extrauniversity Activities
  • Member of the Union of Czech Mathematicians and Physicists, Member of the European Physical Society, Member of the American Physical Society. Member of the Czech national committee of IUPAP. Member of the Council of the Institute of Physics, ASCR Prague.
Appreciation of Science Community
  • Invited lectures at the universities of Linz, Aarhus, Copenhagen, Regensburg, Groningen, Houston, TU Vienna, Fribourg, KHU Seoul; at ICMAB Barcelona, IMEC Leuven, KFKI Budapest, ISAS Berlin, KIST Seoul; EPHTSC Kirchberg (1992), LEES2 Trest (1995), AS-ASFPCNS, Halle (1997), WE Stuttgart (2004), ICSE V Albany, ICSE Berlin. Chairman of the ICSE-3 conference, Vienna 2003. In 2000, elected Fellow of the Institute of Physics (Great Britain). In 2003, elected fellow of The Learned Society of the Czech Republic. 2012: J.M. Marci medal. 2015: Gold medal FSI VUT Brno.
Selected Publications
  • HALE, Nathan, Matthias HARTL, Josef HUMLÍČEK, Christoph BRUNE a Morten KILDEMO. Dielectric function and band gap determination of single crystal CuFeS2 using FTIR-VIS-UV spectroscopic ellipsometry. Optical Materials Express. WASHINGTON: Optica Publishing Group, roč. 13, č. 7, s. 2020-2035. ISSN 2159-3930. doi:10.1364/OME.493426. 2023. URL info
  • HUMLÍČEK, Josef, Karla KULDOVA, Richard KRUMPOLEC a David Campbell CAMERON. Ellipsometry, reflectance, and photoluminescence of nanocrystalline CuCl thin films on silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. MELVILLE: A V S AMER INST PHYSICS, roč. 37, č. 5, s. 1-5. ISSN 2166-2746. doi:10.1116/1.5121240. 2019. URL info
  • KLENOVSKÝ, Petr, Jaroslav ZŮDA, Petr KLAPETEK a Josef HUMLÍČEK. Ellipsometry of surface layers on a 1-kg sphere from natural silicon. Applied Surface Science. AMSTERDAM: ELSEVIER SCIENCE BV, roč. 421, January, s. 542-546. ISSN 0169-4332. doi:10.1016/j.apsusc.2016.08.135. 2017. info
  • HUMLÍČEK, Josef a Jan ŠIK. Optical functions of silicon from reflectance and ellipsometry on silicon-on-insulator and homoepitaxial samples. Journal of Applied Physics. Melville (USA): American Institute of Physics, roč. 118, č. 19, s. nestránkováno, 6 s. ISSN 0021-8979. doi:10.1063/1.4936126. 2015. URL info
  • HUMLÍČEK, Josef, Dušan HEMZAL, Adam DUBROKA, Ondřej CAHA, Hubert STEINER, Gunther BAUER a Guenther SPRINGHOLZ. Raman and interband optical spectra of epitaxial layers of the topological insulators Bi2Te3 and Bi2Se3 on BaF2 substrates. Physica Scripta. Bristol (England): Royal Swedish Academy of Sciences, T162, September, s. "nestránkováno", 4 s. ISSN 0031-8949. doi:10.1088/0031-8949/2014/T162/014007. 2014. URL info
  • HUMLÍČEK, Josef. Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations. In Maria Losurdo; Kurt Hingerl. Ellipsometry at the Nanoscale. Berlin: Springer. s. 145-178. ISBN 978-3-642-33955-4. doi:10.1007/978-3-642-33956-1_3. 2013. URL info
  • CAHA, Ondřej, P. KOSTELNÍK, Jan ŠIK, Y.D. KIM a Josef HUMLÍČEK. Lattice constants and optical response of pseudomorph Si-rich SiGe:B. Applied Physics Letters. USA: American institute of physics, roč. 103, č. 20, s. "nestránkováno", 4 s. ISSN 0003-6951. doi:10.1063/1.4830367. 2013. info
  • CAHA, Ondřej, Adam DUBROKA, Josef HUMLÍČEK, Václav HOLÝ, Hubert STEINER, M. UL-HASSAN, Jaime SANCHEZ-BARRIGA, Oliver RADER, T. N. STANISLAVCHUK, Andrei A. SIRENKO, Günther BAUER a Günter SPRINGHOLZ. Growth, Structure, and Electronic Properties of Epitaxial Bismuth Telluride Topological Insulator Films on BaF2 (111) Substrates. Crystal Growth & Design. Washington: American Chemical Society, roč. 13, č. 8, s. 3365-3373. ISSN 1528-7483. doi:10.1021/cg400048g. 2013. info
  • KLENOVSKÝ, Petr, Moritz BREHM, Vlastimil KŘÁPEK, Elisabeth LAUSECKER, Dominik MUNZAR, Florian HACKL, Hubert STEINER, Thomas FROMHERZ, Günther BAUER a Josef HUMLÍČEK. Excitation intensity dependence of photoluminescence spectra of SiGe quantum dots grown on prepatterned Si substrates: Evidence for biexcitonic transition. Physical Review B. USA: The American Physical Society, roč. 86, č. 11, s. "nestránkováno", 8 s. ISSN 1098-0121. doi:10.1103/PhysRevB.86.115305. 2012. URL info
  • JUNG, Yong Woo, J.S. BYUN, Y.D. KIM, Dušan HEMZAL a Josef HUMLÍČEK. Study of the Interaction Between HSA and Oligo-DNA Using Total Internal Reflection Ellipsometry. JOURNAL OF THE KOREAN PHYSICAL SOCIETY. Seoul: Korean Physical Soc, roč. 60, č. 8, s. 1288-1291. ISSN 0374-4884. doi:10.3938/jkps.60.1288. 2012. URL info
  • MÜNZ, Filip, Josef HUMLÍČEK a Přemysl MARŠÍK. Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometry. Thin Solid Films. Elsevier, roč. 519, č. 9, s. 2703-2706. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.063. 2011. info
  • HUMLÍČEK, Josef. Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterials. Thin Solid Films. Elsevier, roč. 519, č. 9, s. 2655-2658. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.055. 2011. info
  • HUMLÍČEK, Josef, Alois NEBOJSA, Filip MÜNZ, Milka MIRIC a Rados GAJIC. Infrared ellipsometry of highly oriented pyrolytic graphite. Thin Solid Films. Elsevier, roč. 519, č. 9, s. 2624-2626. ISSN 0040-6090. doi:10.1016/j.tsf.2010.12.091. 2011. info
  • GLADKOV, Petar, Josef HUMLÍČEK, Eduard HULICIUS, Tomislav ŠIMEČEK, Tanya PASKOVA a Keith EVANS. Effect of Fe doping on optical properties of freestanding semi-insulating HVPE GaN:Fe. Journal of crystal growth. Amsterdam: Elsevier Science, roč. 312, č. 8, s. 1205-1209. ISSN 0022-0248. 2010. info
  • HUMLÍČEK, Josef. Efficient dealing with spectrum line profiles using complex rational functions. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, roč. 111, č. 11, s. 1543–1544. ISSN 0022-4073. 2010. info
  • HUMLÍČEK, Josef. In-situ spectroscopic ellipsometry: optimization of monitoring and closed-loop-control procedures. physica status solidi (a), Applied research. Berlin: Akademie-Verlag, roč. 205, č. 4, s. 793-796. ISSN 1862-6300. 2008. info
  • HOSPODKOVÁ, Alice, Vlastimil KŘÁPEK, Karla KULDOVÁ a Josef HUMLÍČEK. Photoluminescence and magnetophotoluminescence of vertically stacked InAs/GaAs quantum dot structures. Physica E. Amsterdam: Elsevier Science, roč. 36, č. 1, s. 106-113. ISSN 1386-9477. 2007. info
  • KŘÁPEK, Vlastimil, Karla KULDOVÁ, Jiří OSWALD, Alice HOSPODKOVÁ, Eduard HULICIUS a Josef HUMLÍČEK. Electron states and magnetophotoluminescence of elongated InAs/GaAs quantum dots. In CP893, Physics of Semiconductors: 28th International Conference on the Physics of Semiconductors. USA: American Institute of Physics. s. 901-902. ISBN 978-0-7354-0397-0. 2007. info
  • HUMLÍČEK, Josef, Richard ŠTOUDEK a Adam DUBROKA. Infrared vibrations of interstitial oxygen in silicon-rich SiGe alloys. Physica B. Amsterdam: Elsevier Science, roč. 376-377, č. 6, s. 212-215. ISSN 0921-4526. 2006. info
  • KULDOVÁ, Karla, Vlastimil KŘÁPEK, Alice HOSPODKOVÁ, Jiří OSWALD, Jiří PANGRÁC, Karel MELICHAR, Eduard HULICIUS, Marek POTEMSKI a Josef HUMLÍČEK. 1.3 mum emission from InAs/GaAs quantum dots. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, roč. 3, č. 11, s. 3811-3814. ISSN 1610-1642. 2006. info
  • HUMLÍČEK, Josef. Polarized light and ellipsometry. In Handbook of Ellipsometry. New York: William Andrew Publishing. s. 3-91. Handbook of Ellipsometry. ISBN 0-8155-1499-9. 2005. koprodukce William Andrew a Springer-Verlag info
  • HUMLÍČEK, Josef, Vlastimil KŘÁPEK a Jan FIKAR. Anisotropy of Absorption and Luminescence of Multilayer InAs/GaAs Quantum Dots. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics. s. 753-754. ISBN 0-7354-0257--4. 2005. info
  • HUMLÍČEK, Josef a Vlastimil KŘÁPEK. Infrared Response of Heavily Doped p-type Si and SiGe Alloys from Ellipsometric Measurements. In CP772, Physics of Semiconductors: 27th International Conference on the Physics of Semiconductors. USA: American Institute of Physics. s. 113-114. ISBN 0-7354-0257--4. 2005. info
  • BERNHARD, Christian, Todd HOLDEN, Alexandr BORIS, Natalia KOVALEVA, Alexei PIMENOV a Josef HUMLÍČEK. Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18. Physical Review B. USA: The American Physical Society, roč. 69, č. 5, s. 2502-4, 4 s. ISSN 0163-1829. 2004. info
  • HOLDEN, Todd, Hanns HABERMEIER, Georg CRISTIANI, Andrzej GOLNIK, Alexander BORIS, Alexei PIMENOV a Josef HUMLÍČEK. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B. USA: The American Physical Society, roč. 69, č. 6, s. 4505 1-7, 7 s. ISSN 1098-0121. 2004. info
  • HUMLÍČEK, Josef a Christian BERNHARD. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films. Oxford: Elsevier, roč. 455-456, č. 1, s. 177-182. ISSN 0040-6090. 2004. info
  • BERNHARD, Christian, Josef HUMLÍČEK a Bernhard KEIMER. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. Thin Solid Films. Oxford: Elsevier, roč. 455-456, č. 1, s. 143-149. ISSN 0040-6090. 2004. info
  • BERNHARD, C., T. HOLDEN, Josef HUMLÍČEK, Dominik MUNZAR a A. GOLNIK. In-plane polarized collective modes in detwinned YBa2Cu3O6.95 observed by spectral ellipsometry. Solid state communications. Velká Britanie: Pergamon-Elsevier Science, roč. 121, č. 2, s. 93-97. ISSN 0038-1098. 2002. info
  • HUMLÍČEK, Josef a Miquel GARRIGA. Temperature Dependence of the Optical Spectra of SiGe Alloys. In PANTELIDES, Sokrates T. a Stefan ZOLLNER. Silicon-Germanium Carbon Alloys. New York: Taylor & Francis. s. 483-530. Optoelectronic Properties of Semicond. and SL, 15. ISBN 1-56032-963-7. 2002. info
  • HUMLÍČEK, Josef, Dominik MUNZAR, Karel NAVRÁTIL a Michal LORENC. Polarization anisotropy of photoluminescence from multilayer InAs/GaAs quantum dots. Physica E. Amsterdam: Elsevier Science, roč. 13, č. 2, s. 229-232. ISSN 1386-9477. 2002. info
  • BOČÁNEK, Luděk, Blanka HANDLÍŘOVÁ a Josef HUMLÍČEK. Temperature dependence of optical spectra of C 60 thin films. Fullerene Science and Technology. New York: Marcel Dekker, Inc, roč. 8 (2000), 4-5, s. 267-278. ISSN 1064-122X. 2000. info
  • HUMLÍČEK, Josef, Ralf HENN a Manuel CARDONA. Infrared vibrations in LaSrGaO4 and LaSrAlO4. Phys. Rev. B. USA: The American Phys. Society, roč. 61, č. 21, s. 14554-14563. ISSN 0163-1829. 2000. info
  • ŠIK, Jan a Josef HUMLÍČEK. Near-band-gap optical functions spectra and band-gap energies of GaNAs/GaAs superlattice. Appl. Phys. Lett. USA: Institute of Physics, roč. 76, č. 20, s. 2859-2861. ISSN 0003-6951. 2000. info
  • BERNHARD, C., Dominik MUNZAR, A. GOLNIK,LIN,WITTLIN, Josef HUMLÍČEK a M. CARDONA. Anomaly of oxygen bond-bending mode at 320 cm-1 and additional absorption peak in the c-axis infrared conductivity of underdoped YBa2Cu3O7 single crystals. Physical Review B. USA: The American Physical Society, roč. 61, č. 1, s. 618-626. ISSN 0163-1829. 2000. info
  • HUMLÍČEK, Josef. Infrared Spectroscopy of LiF on Ag and Si. Phys.stat.sol.(b). Germany, roč. 215(1999), -, s. 155-159, 1999. info
  • NAVRÁTIL, Karel, Jan ŠIK, Josef HUMLÍČEK a S. NEŠPŮREK. Optical properties of thin films of poly(methyl-phenylsilylene). Optical Materials. Amsterdam: Elsevier, roč. 1999, č. 12, s. 105-113. ISSN 0925-3467. 1999. info
  • MUNZAR, Dominik, C. BERNHARD, A. GOLNIK, Josef HUMLÍČEK a M. CARDONA. A New Interpretation of the Phonon Anomalies in the Far-Infrared c-Axis Conductivity of Underdoped YBa2Cu30y. Phys. Stat. Sol. (b). Berlin: Wiley-VCH, roč. 215(1999), -, s. 557-561, 1999. info
  • MUNZAR, Dominik, C. BERNHARD, A. GOLNIK, Josef HUMLÍČEK a M. CARDONA. Anomalies of the infrared-active phonons in underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect. Solid state communications. Velká Britanie: Pergamon, (112)1999, -, s. 365-369. ISSN 0038-1098. 1999. info
  • MUNZAR, Dominik, C. BERNHARD, A. GOLNIK, Josef HUMLÍČEK a M. CARDONA. Phonon Anomalies in the Far-Infrared c-Axis Conductivity of Underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect. Journal of Low Temperature Physics. USA: Plenum Publishing Corporation, roč. 117(1999), 5/6, s. 1049-1053. ISSN 0022-2291. 1999. info
  • GOLNIK, A., Ch. BERNHARD, Josef HUMLÍČEK, M. KLAESER a M. CARDONA. The far-infrared in-plane conductiivity of YBaCuO studied by ellipsometry. physics status solidi (b). roč. 215, č. 1, s. 553-556, 1999. info
  • HUMLÍČEK, Josef. Silicon-germanium alloys (Si x Ge 1-x) revisited. In Handbook of optical Constants of solids III. 1. vyd. USA: Academic Press. s. 537-552. ISBN 0-12-544423-0. 1998. info
  • HUMLÍČEK, Josef. Infrared ellipsometry of LiF. Thin Solid Films. UK Oxford: Elsevier science, roč. 1998, 313-314, s. 687-691. ISSN 0040-6090. 1998. info
  • HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, roč. 1998, 313-314, s. 656-660. ISSN 0040-6090. 1998. info
  • HUMLÍČEK, Josef, Alois NEBOJSA, J. HORA, M. STRÁSKÝ, J. SPOUSTA a T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, roč. 1998, č. 332, s. 25-29. ISSN 0040-6090. 1998. info
  • BORTCHAGOVSKY, E., I. YURCHENKO, Z. KAZANTSEVA, Josef HUMLÍČEK a J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films. UK Oxford: Elsevier science, roč. 1998, 313-314, s. 795-798. ISSN 0040-6090. 1998. info
  • ŠIK, Jan, Jaroslav HORA a Josef HUMLÍČEK. Optical functions of silicon at high temperatures. Journal of Applied Physics. USA: American institute of physics, roč. 1998, č. 11, s. 6291-6298. ISSN 0021-8979. 1998. info
  • HANDLÍŘOVÁ, Blanka, Josef HUMLÍČEK, Luděk BOČÁNEK, T. NGUYEN MANH a H. SITTER. Thermally modulated optical response of C 60 thin films in the region of absorption edge. Molecular nanostructures. World Scientific Publishing Company, roč. 1998, -, s. 155-158, 1997. info
  • HORA, Jaroslav, Petr PÁNEK, Karel NAVRÁTIL a Josef HUMLÍČEK. Optical response of C60 thin films and solutions. Physical Review B. USA: The American Physical Society, roč. 54(1996), č. 7, s. 5106-5113. ISSN 0163-1829. 1996. info
  • HORA, Jaroslav, Karel NAVRÁTIL a Josef HUMLÍČEK. Optical Anisotropy of SrLaAlO(4) and SrLaAl(0.75)Ga(0.25) O(4) Single Crystals. Phys. Stat. Sol. (b). Berlin: Wiley-VCH, roč. 1996, č. 195, s. 625-635, 1996. info
  • HUMLÍČEK, Josef, R. HENN a M. CARDONA. Far-infrared Ellipsometry of Depleted Surface Layer in Heavily Doped N-type GaAs. Appl. Phys. Lett. USA: Institute of Physics, roč. 69(1996), č. 17, s. 2581-2583. ISSN 0003-6951. 1996. info
  • HUMLÍČEK, Josef. Infrared Electrodynamics From Ellipsometric Measurements. Ferroelectrics. Amsterdam: OPA, roč. 1996, č. 176, s. 221-238, 1996. info
  • HUMLÍČEK, Josef, Luděk BOČÁNEK, Karel NAVRÁTIL, Petr PÁNEK a Radoslav ŠVEHLA. Excition-polariton edge of GaAs: MBE layers between multiple-quantum-well structures. Solid State Communications. UK: Elsevier Science, roč. 93(1995), č. 9, s. 725-728. ISSN 0038-1098. 1995. info
  • HUMLÍČEK, Josef. Optical spectroscopy of SiGe. In Silicon Germanium. London, UK: University of Stuttgart, Germany. s. 116-120. INSPEC. ISBN 0-85296-826-4. 1995. info
  • HUMLÍČEK, Josef. Optical functions of the relaxed SiGe alloy and influence of strain. In Silicon Germanium. London, UK: University of Stuttgart, Germany. s. 121-131. INSPEC. ISBN 0-85296-826-4. 1995. info
  • PÁNEK, Petr, Dominik MUNZAR, Josef HUMLÍČEK a František LUKEŠ. Photoreflectance Study of a Fibonacci Superlattice. physica status solidi (b). Berlin: J. Wiley, roč. 190(1995), č. 1995, s. 579-586. ISSN 0370-1972. 1995. info
  • HUMLÍČEK, Josef, C. THOMSEN a M. CARDONA. Far-infrared response of free carriers in YBA 2 Cu 3 O 7 from ellipsometric measurements. Physica C. Holland: Elsevier, roč. 222, č. 1, s. 166-172. ISSN 0921-4534. 1994. info
  • HUMLÍČEK, Josef. Transverse and longitudinal vibration modes in alpha-quartz. Philosophical Magazine B. Taylor and Francis, roč. 70(1994), č. 3, s. 699-710, 1994. info
  • HUMLÍČEK, Josef a Miquel GARRIGA. Temperature dependence of the refractive index of crystalline germanium-silicon alloys. Appl. Phys. A. Springer-Verlag, roč. 1993, č. 2, s. 259-261, 1993. info
  • HUMLÍČEK, Josef, A.P. LITVINCHUK a W. KRESS. Lattice vibrations of Y(1-x) Pr( x) Ba(2)Cu(3)O(7): theory and experiment. Physica C. Holland: Elsevier, roč. 1993, č. 3, s. 345-359. ISSN 0921-4534. 1993. info
  • HUMLÍČEK, Josef, Eduard SCHMIDT, Luděk BOČÁNEK a Radoslav ŠVEHLA. Exciton line shapes of GaAs/AlAs multiple quantum wells. Phys. Rev. B. USA: The American Phys. Society, roč. 48(1993), č. 8, s. 5241-5248. ISSN 0163-1829. 1993. info
  • HUMLÍČEK, Josef. Normal-state infrared response from ellipsometric measurements: YBa(2)Cu(3)O(7) and PrBa(2)Cu(3)O(7). In Electronic Properties of high-Tc Superconductors. 1. vyd. Berlin, Heidelberg: Springer Verlag. s. 244-248. Springer Series in Solid-State Sciences, vol. 113. ISBN 3-540-56195-1. 1993. info
  • HUMLÍČEK, Josef, K. KAMARAS a J. KIRCHER. Mid- and near - IR ellipsometry of Y 1-x Pr x Ba 2 Cu 3 O 7 epitaxial films. Thin Solid Films. UK Oxford: Elsevier science, roč. 234, č. 1, s. 518-521. ISSN 0040-6090. 1993. info
  • HUMLÍČEK, Josef a Arnulf ROESELER. IR ellipsometry of the highly anisotropic materials alpha - SiO2 and alpha-Al2O3. Thin Solid Films. UK Oxford: Elsevier science, roč. 234, č. 1, s. 332-336. ISSN 0040-6090. 1993. info
  • HUMLÍČEK, Josef. Sensitivity of optical measurements of planar stratified structures and reduction of experimentsl data. 1. vyd. Brno: Masaryk University Brno. 99 s. FOLIA Fac. Sci. Nat. UM Brunensis, Physica 49. ISBN 80-210-0423-1. 1993. info
  • HUMLÍČEK, Josef. Infrared refracctive index of germanium-silicon alloy crystals. Appl. Opt. roč. 31(1992), č. 1, s. 90-94, 1993. info
  • ZOLLNER, S. a Josef HUMLÍČEK. Temperature dependence of the dielectric function and the interband critical-point parameters of GaP. Thin Solid Films. UK Oxford: Elsevier science, roč. 1993, -, s. 185-188. ISSN 0040-6090. 1993. info
  • ZOLLNER, S., M. GARRIGA, J. KIRCHER, Josef HUMLÍČEK, M. CARDONA a G. NEUHOLD. Temperature dependence of the dielectric function and the interband critical-point parameters of GaP. Phys. Rev. B. USA: The American Phys. Society, roč. 48, č. 11, s. 7915-7929. ISSN 0163-1829. 1993. info
  • HUMLÍČEK, Josef, Arnulf ROESELER, Thomas ZETTLER, Maria KEKOUA a Elza KHOUTSISHVILI. Infrared refractive index of germanium-silicon alloy crystals. Applied Optics. USA: Optical Society of America, roč. 31, č. 1, s. 90-94. ISSN 0003-6935. 1992. info
  • SCHMID, Uwe, Josef HUMLÍČEK, František LUKEŠ a Manuel CARDONA. Optical transitions in strained Ge/Si superlattices. Physical Review B. USA: The American Physical Society, roč. 45, č. 12, s. 6793-6801. ISSN 0163-1829. 1992. info
  • KIRCHER, J., Josef HUMLÍČEK, Miquel GARRIGA a Manuel CARDONA. Interband transitions in YBa(2)Cu(3)O(7). Physica C. Holland: Elsevier, roč. 192, č. 5, s. 473-480. ISSN 0921-4534. 1992. info
  • SCHMID, U., Josef HUMLÍČEK, F. LUKEŠ a M. CARDONA. Optical transitions in strained Si/Ge superlattices. Thin Solid Films. Oxford, UK: Elsevier science, roč. 222, č. 2, s. 246-250. ISSN 0040-6090. 1992. info
  • HUMLÍČEK, Josef a František LUKEŠ. REFLECTANCE AND PHOTOREFLECTANCE SPECTRA OF GAAS/ALAS SUPERLATTICES. Superlattices and Microstructures. London: ACADEMIC PRESS LTD, LONDON, roč. 9, č. 1, s. 133-136. ISSN 0749-6036. 1991. info
  • HUMLÍČEK, Josef. OPTICAL-SPECTRA OF SIXGE1-X ALLOYS. J. Appl. Phys. USA: American Institute of Physics, roč. 65, č. 7, s. 2827-2832. ISSN 0021-8979. 1989. info
  • HUMLÍČEK, Josef, M. GARRIGA a M. CARDONA. TEMPERATURE-DEPENDENCE OF OPTICAL-EXCITATIONS IN YBA2CU3O6, SMBA2CU3O6. Solid state communications. Velká Britanie: Pergamon, roč. 67, č. 6, s. 589-592. ISSN 0038-1098. 1988. info
  • HUMLÍČEK, Josef. SENSITIVITY EXTREMA IN MULTIPLE-ANGLE ELLIPSOMETRY. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A. OPTICAL SOC AMER, WASHINGTON, roč. 2, č. 5, s. 713-722. ISSN 0740-3232. 1985. info
  • HUMLÍČEK, Josef. Optimized computation of the Voigt and complex probability functions. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, roč. 27, č. 4, s. 437-444. ISSN 0022-4073. 1982. info
  • HUMLÍČEK, Josef. An efficient method for evaluation of the complex probability function: the Voigt function and its derivatives. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. Oxford: PERGAMON-ELSEVIER SCIENCE LTD, OXFORD, roč. 21, s. 309-313. ISSN 0022-4073. 1978. info

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