Mgr. Jiří Vohánka, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02002
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3357 |
---|
social and academic networks: |
---|
Total number of publications: 45
2019
-
Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
Thin Solid Films, year: 2019, volume: 692, edition: 31 December 2019, DOI
-
Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers
Surface Topography: Metrology and Properties, year: 2019, volume: 7, edition: 4, DOI
-
Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory
Physica Scripta, year: 2019, volume: 94, edition: 4, DOI
-
Evaluation of the Dawson function and its antiderivative needed for the Gaussian broadening of piecewise polynomial functions
Journal of Vacuum Science & Technology B, year: 2019, volume: 37, edition: 6, DOI
-
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model
Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, year: 2019, volume: 37, edition: 6, DOI
-
Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
Coatings, year: 2019, volume: 9, edition: 7, DOI
-
Optical properties of the crystalline silicon wafers described using the universal dispersion model
Journal of Vacuum Science & Technology B, year: 2019, volume: 37, edition: 6, DOI
-
Temperature dependent dispersion models applicable in solid state physics
Journal of Electrical Engineering, year: 2019, volume: 70, edition: 7, DOI
2018
-
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
Journal of Applied Physics, year: 2018, volume: 123, edition: 18, DOI
-
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
Surface and Interface Analysis, year: 2018, volume: 50, edition: 11, DOI