Publication details

Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion

Authors

PENTTINEN Niko HASOŇ Stanislav SILVENNOINEN Martti JOSKA Luděk SILVENNOINEN Raimo

Year of publication 2012
Type Article in Periodical
Magazine / Source Optics Communications
MU Faculty or unit

Faculty of Medicine

Citation
Doi http://dx.doi.org/10.1016/j.optcom.2011.11.080
Field ORL, ophthalmology, stomatology
Keywords Permittivity; XPS titanium; Diffractive optical element-based sensor
Description A reflection models from a XPS characterized titanium surface were calculated using Bruggemans model. These models were tested in a diffractive optical element-based sensor measurements, while the samples were immersed in a phosphate buffered saline solution. A second reflectance model of a material thickness on a titanium surface was conducted, to further evaluate the reflectance information gathered with diffractive optical element-based sensor.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.

More info