Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction

• Authors: JERGEL M.; HOLÝ Václav
• Year of publication: 1995
• Type: Article in Periodical
• Magazine / Source: J. Phys. D: Appl. Phys.
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism

Related projects

• Physical properties of new materials and layered structures