Publication details

Microdiffraction imaging of dislocation densities in microstructured samples

Authors

LÜBBERT D. BAUMBACH T. HOLÝ Václav MIKULÍK Petr HELFEN L. PERNOT P. ELLYAN M. KELLER S. KATONA T.M. DENBAARS S.P. SPECK J.

Year of publication 2008
Type Article in Periodical
Magazine / Source Europhysics Letters
MU Faculty or unit

Faculty of Science

Citation
Web http://www.sci.muni.cz/~mikulik/Publications.html#LubbertBaumbachHoly-EPL-2008
Field Solid matter physics and magnetism
Keywords X-ray diffraction; X-ray topography; Microdiffraction; Rocking curve imaging; Dislocations; GaN
Description A full field X-ray microdiffraction technique is developed providing simultaneously both micrometer-resolved information of crystalline perfection as well as statistical information about the macroscopically illuminated sample. The method allows a detailed characterization of patterned substrates grown by epitaxial lateral overgrowth. Local wing tilts and their fluctuation over the sample area as well as the local and average number of grains in the wings are determined, and the reduction of threading dislocation densities in the grains of the ELO wings can be quantitatively estimated.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.

More info