Informace o publikaci

Evolution of strain across the magnetostructural phase transition in epitaxial FeRh films on different substrates

Autoři

ARREGI Jon Ander CAHA Ondřej UHLÍŘ Vojtěch

Rok publikování 2020
Druh Článek v odborném periodiku
Časopis / Zdroj Physical Review B
Fakulta / Pracoviště MU

Přírodovědecká fakulta

Citace
www https://doi.org/10.1103/PhysRevB.101.174413
Doi http://dx.doi.org/10.1103/PhysRevB.101.174413
Klíčová slova Antiferromagnetism; Epitaxial strain; Ferromagnetism; First order phase transitions; Magnetic phase transitions
Popis We present a detailed x-ray diffraction study of the structural evolution of epitaxial FeRh films across the temperature-driven phase transition between antiferromagnetic and ferromagnetic order. FeRh films grown onto MgO, W/MgO, and Al2O3 substrates show qualitatively different lattice distortions (tetragonal vs rhombohedral), while keeping a sharp transition above room temperature. Temperature-dependent x-ray reciprocal space mapping reveals the phase-specific crystal structure, giving access to both in-plane and out-of-plane lattice parameters and crystalline coherence lengths across different stages of the phase transition. Diffuse x-ray scattering from relaxed films is treated via a mosaic block model, which provides a robust data fitting scheme. It is found that the ferromagnetic phase fraction can stand a larger amount of strain before completely annihilating and transitioning to the antiferromagnetic phase upon cooling, as compared to heating. This is related to the distinct magnetic exchange correlations in the antiferromagnetic and ferromagnetic parent phases.

Používáte starou verzi internetového prohlížeče. Doporučujeme aktualizovat Váš prohlížeč na nejnovější verzi.

Další info