Informace o publikaci
Characterization of near field optical microscope probes
| Název česky | Charakterizace sond do mikroskopu blízkého pole |
|---|---|
| Autoři | |
| Rok publikování | 2008 |
| Druh | Článek v odborném periodiku |
| Časopis / Zdroj | Surface and Interface Analysis |
| Fakulta / Pracoviště MU | |
| Citace | |
| Obor | Optika, masery a lasery |
| Klíčová slova | near field scanning optical microscopy;image artefacts;optical analysis |
| Popis | In this article the far-field radiation analysis of near-field optical probes is presented. It is shown that the quality of probes used for near-field scanning microscopy imaging can be estimated using directional measurements of the far-field radiation patterns. Experimental results are compared with numerical modeling of far-field radiation performed using finite difference in time-domain method (FDTD) and with SEM characterization of real probe geometry. The effects of probe geometry on real measurement on different samples are studied as well. |
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