prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2011
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Ellipsometric characterisation of thin films non-uniform in thickness
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Measurement of the thickness distribution and optical constants of non-uniform thin films
Measurement Science and Technology, year: 2011, volume: 22, edition: 8, DOI
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Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Optical characterization of HfO2 thin films
Thin Solid Films, year: 2011, volume: 519, edition: 18, DOI
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Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
Journal of Optics, year: 2011, volume: 13, edition: 8, DOI
2010
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Development of transparent protective coatings on polycarbonate substrates using PECVD
Year: 2010, type: Conference abstract
2009
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Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
Diamond and Related Materials, year: 2009, volume: 18, edition: 2-3
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Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
Journal of Optoelectronics and Advanced Materials, year: 2009, volume: 11, edition: 12
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Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
Diamond and Related Materials, year: 2009, volume: 18, edition: 2-3, DOI
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Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates
PHYSICS OF SEMICONDUCTORS, year: 2009