Mgr. Jiří Vohánka, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02002
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3357 |
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social and academic networks: |
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Total number of publications: 47
2018
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Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region
Journal of Applied Physics, year: 2018, volume: 123, edition: 18, DOI
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Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
Surface and Interface Analysis, year: 2018, volume: 50, edition: 11, DOI
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Ellipsometry of Layered Systems
Optical Characterization of Thin Solid Films, year: 2018, number of pages: 35 s.
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Optical Characterization of Thin Films Exhibiting Defects
Optical Characterization of Thin Solid Films, year: 2018, number of pages: 43 s.
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Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
Journal of modern optics, year: 2018, volume: 65, edition: 14, DOI
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Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
Optical Characterization of Thin Solid Films, year: 2018, number of pages: 52 s.
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Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
Surface and Interface Analysis, year: 2018, volume: 50, edition: 7, DOI
2017
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Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
Thin Solid Films, year: 2017, volume: 631, edition: June, DOI
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Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
Applied Surface Science, year: 2017, volume: 419, edition: October, DOI
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Temperature-dependent dispersion model of float zone crystalline silicon
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI