Publication details
Diffraction effects in infrared ellipsometry of conducting samples
| Authors | |
|---|---|
| Year of publication | 2004 |
| Type | Article in Periodical |
| Magazine / Source | Thin Solid Films |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | Infrared ellipsometry; Diffraction; Metals |
| Description | We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper. |
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