prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
---|---|
E‑mail: |
social and academic networks: |
---|
Total number of publications: 199
2021
-
Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization
Coatings, year: 2021, volume: 11, edition: 1, DOI
-
Vysoceodrazná vrstva na substrátu ve specifikaci R >= 98,5 % @ 248 nm a R >= 98 % @ 213 nm pro úhel dopadu 45.
Year: 2021
2020
-
Antireflexní vrstva na substrátu ve specifikaci T>=99,8 %@ 248 nm a T>=98,5 % @ 213 nm.
Year: 2020
-
Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry
Applied Surface Science, year: 2020, volume: 534, edition: December 2020, DOI
-
Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials
Optics Express, year: 2020, volume: 28, edition: 4, DOI
-
Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films
Optics Express, year: 2020, volume: 28, edition: 24, DOI
-
Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism
Physica Scripta, year: 2020, volume: 95, edition: 9, DOI
-
Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
Optics Express, year: 2020, volume: 28, edition: 1, DOI
2019
-
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
Journal of Electrical Engineering, year: 2019, volume: 70, edition: 7, DOI
-
Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model
Thin Solid Films, year: 2019, volume: 692, edition: 31 December 2019, DOI