prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2018
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Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
Journal of modern optics, year: 2018, volume: 65, edition: 14, DOI
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Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
Surface and Interface Analysis, year: 2018, volume: 50, edition: 7, DOI
2017
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Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution
Measurement Science and Technology, year: 2017, volume: 28, edition: 2, DOI
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Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
Thin Solid Films, year: 2017, volume: 631, edition: June, DOI
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Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
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Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
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Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory
Applied Surface Science, year: 2017, volume: 419, edition: October, DOI
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Temperature-dependent dispersion model of float zone crystalline silicon
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
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Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
2016
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Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range
Advanced Optical Materials, year: 2016, volume: 4, edition: 11, DOI