doc. RNDr. Vilma Buršíková, Ph.D.
Associate professor, Deposition of Thin films and Nanostructures
Office: pav. 06/02006
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3368 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 521
2020
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Atmospheric Pressure Plasma Polymerized 2-Ethyl-2-oxazoline Based Thin Films for Biomedical Purposes.
Polymers, year: 2020, volume: 12, edition: 11, DOI
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Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge
Progress in Organic Coatings, year: 2020, volume: 149, edition: December 2020, DOI
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Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry
Applied Surface Science, year: 2020, volume: 534, edition: December 2020, DOI
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Development of plasma enhanced chemical vapor deposition reactor for preparation of oxygen containing organosilazane polymer thin films
11th International Conference on Nanomaterials - Research & Application (NANOCON 2019), year: 2020
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Dynamic impact wear and impact resistance of W-B-C coatings
Proceedings of the 14th International Conference on Local Mechanical Properties - LMP 2019, year: 2020
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Effect of substrate bias voltage on the composition, microstructure andmechanical properties of W-B-C coatings
Applied Surface Science, year: 2020, volume: 528, edition: OCT 30 2020, DOI
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Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials
Optics Express, year: 2020, volume: 28, edition: 4, DOI
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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films
Optics Express, year: 2020, volume: 28, edition: 24, DOI
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Characterization of Platinum-Based Thin Films Deposited by Thermionic Vacuum Arc (TVA) Method
Materials, year: 2020, volume: 13, edition: 7, DOI
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Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers
Optics Express, year: 2020, volume: 28, edition: 1, DOI