Publication details

X-ray diffraction and reflectance, raman scattering and photoluminiscence characterization of thermally annealed epitaxial Si 1-x Ge x layers

Authors

LÍBEZNÝ Milan HOLÝ Václav KUBĚNA Josef

Year of publication 1993
Type Article in Periodical
Magazine / Source Thin Solid Films
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords X-ray diffraction and reflectance; raman scattering and photoluminiscence characterization of thermally annealed epitaxial Si 1-x Ge x layers
Description X-ray diffraction and reflectance, raman scattering and photoluminiscence characterization of thermally annealed epitaxial Si 1-x Ge x layers
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