Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2005
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Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
Journal of Modern Optics, year: 2005, volume: 52, edition: 4
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Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
Vacuum, year: 2005, volume: 80, edition: 1-3
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Optical measurement of mechanical stresses in diamond-like carbon films
8-th International Symposium on Laser Metrology, year: 2005
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Optical properties of NiO thin films prepared by pulsed laser deposition technique
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Spectroscopic ellipsometry of sinusoidal surface-relief gratings
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Thermal stability of the optical properties of plasma deposited diamond-like carbon thin films
Diamond and Related Materials, year: 2005, volume: 14, edition: 11-12
2004
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Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
Thin Solid Films, year: 2004, volume: 455-456, edition: 1
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Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
Surface and Interface Analysis, year: 2004, volume: 36, edition: 8