Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2003
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Optical properties of diamond-like carbon films containing SiOx
Diamond and Related Materials, year: 2003, volume: 12, edition: 9
2002
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Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1
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Applications of atomic force microscopy for thin film boundary measurements
Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7
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Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1
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Influence of overlayers on determination of the optical constants of ZnSe thin films
Journal of Applied Physics, year: 2002, volume: 92, edition: 4
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Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
Diamond and Related Materials, year: 2002, volume: 11, edition: 1
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Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1
2001
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Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy
Surface and Interface Analysis, year: 2001, volume: 32, edition: 1
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Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 2001
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Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method
Journal of Optoelectronics and Advanced Materials, year: 2001, volume: 3, edition: 4