prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2003
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New Dispersion Model of the Optical Constants of the DLC Films
Acta Physica Slovaca, year: 2003, volume: 53, edition: 5
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New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters
Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B
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Optical constants of ZnTe and ZnSe epitaxial thin films
Acta Physica Slovaca, year: 2003, volume: 53, edition: 2
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Optical characterization of ZnSe thin films
19th Congress of the International Commission for Optics: Optics for the Quality of Life, year: 2003
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Optical properties of diamond-like carbon films containing SiOx
Diamond and Related Materials, year: 2003, volume: 12, edition: 9
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Srovnání snímků NSOM a AFM při studiu vybraných objektů
Československý časopis pro fyziku, year: 2003, volume: 47, edition: 6-7s
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Theoretical analysis of the atomic force microscopy characterization of columnar thin films
Ultramicroscopy, year: 2003, volume: 94, edition: 1
2002
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Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1
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Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků
Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7
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Applications of atomic force microscopy for thin film boundary measurements
Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7