prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2001
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Optical Characterization of Chalcogenide Thin Films
Applied Surface Science, year: 2001, volume: 175-176, edition: 1
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Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances
Applied Optics, year: 2001, volume: 40, edition: 31
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Study of Thin Film Defects by Atomic Force Microscopy
Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods, year: 2001
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Vliv diskrétní Fourierovy transformace na zpracování AFM dat
Československý časopis pro fyziku, year: 2001, volume: 51, edition: 1
2000
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Analysis of Slightly Rough Thin Films by Optical Methods and AFM
Mikrochim. Acta, year: 2000, volume: 132, edition: 1
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Analysis of thin films by optical multi-sample methods
Acta Physica Slovaca, year: 2000, volume: 50, edition: 4
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Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films
Proceedings of the 4th Seminar on Quantitative Microscopy, year: 2000
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Ellipsometry of Thin Film Systems
Progress in Optics, Vol. 41 (Ed. E. Wolf), edition: Vyd. 1, year: 2000, number of pages: 102 s.
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Matrix formalism for imperfect thin films
Acta physica slovaca, year: 2000, volume: 50, edition: 4
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Optical characterization of inhomogeneous thin films of ZrO2 by spectroscopic ellipsometry and spectroscopic reflectometry
Surface and Interface Analysis, year: 2000, volume: 30, edition: 1