prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2014
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Broadening of dielectric response and sum rule conservation
Thin Solid Films, year: 2014, volume: 571, edition: November, DOI
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Consolidated series for efficient calculation of the reflection and transmission in rough multilayers
Optics Express, year: 2014, volume: 22, edition: 4, DOI
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Dispersion model of two-phonon absorption: application to c-Si
OPTICAL MATERIALS EXPRESS, year: 2014, volume: 4, edition: 8, DOI
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Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
Thin Solid Films, year: 2014, volume: 571, edition: November, DOI
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Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
Applied Optics, year: 2014, volume: 53, edition: 25, DOI
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Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
Thin Solid Films, year: 2014, volume: 571, edition: november, DOI
2013
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Advanced modeling for optical characterization of amorphous hydrogenated silicon films
Thin Solid Films, year: 2013, volume: 541, edition: Aug, DOI
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Application of sum rule to the dispersion model of hydrogenated amorphous silicon
Thin Solid Films, year: 2013, volume: 539, edition: Jul, DOI
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Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
Surface and Interface Analysis, year: 2013, volume: 45, edition: 7, DOI
2011
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Anisotropy-enhanced depolarization on transparent film/substrate system
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI