Project information
Project information
Analýza optických vlastností solárních článků
- Project Identification
- FT-TA3/142
- Project Period
- 7/2006 - 12/2009
- Investor / Pogramme / Project type
-
Ministry of Industry and Trade of the CR
- TANDEM
- MU Faculty or unit
- Faculty of Science
- Cooperating Organization
-
Solartec s.r.o.
Publications
Total number of publications: 10
2010
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Near-field optical microscopy simulations using graphics processing units
Surface and Interface Analysis, year: 2010, volume: 42/2010, edition: 6
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Rough surface scattering simulations using graphics cards
Applied Surface Science, year: 2010, volume: 2010, edition: 256
2009
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Combined method of spectroscopic ellipsometry and photometry as an efficient tool for the optical characterisation of chalcogenide thin films
Journal of Optoelectronics and Advanced Materials, year: 2009, volume: 11, edition: 12
-
Precise measurement of thickness distribution of non-uniform thin films by imaging spectroscopic reflectometry
Proceedings of IMEKO XIX World Congress, year: 2009
2008
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Characterization of near field optical microscope probes
Surface and Interface Analysis, year: 2008, volume: 40, edition: 1
-
Influence of cross-correlation effects on the optical quantities of rough films
Optics Express, year: 2008, volume: 16, edition: 11
-
Near field scanning optical microscopy studies of thin film surfaces and interfaces
Applied Surface Science, year: 2008, volume: 254, edition: 12
-
Near-field scanning optical microscope probe analysis
Ultramicroscopy, year: 2008, volume: 108, edition: 7, DOI
-
Optical characterization of non-stoichiometric silicon nitride films
physica status solidi (c), year: 2008, volume: 5, edition: 5
2007
-
Electromagnetic field distribution modelling in microlenses fabrication process
Journal of Physics and Chemistry of Solids, year: 2007, volume: 68, edition: 5-6