Project information
Development of technology of PECVD films formation for automotive lighting equipment
- Project Identification
- FT-TA5/114
- Project Period
- 5/2008 - 12/2010
- Investor / Pogramme / Project type
-
Ministry of Industry and Trade of the CR
- TANDEM
- MU Faculty or unit
- Faculty of Science
- Keywords
- New technology; industrial production; protective films; plasma enhanced chemical vapor deposition; automobile headlamp lens; automobile reflectors; improvement of utility values.
- Cooperating Organization
-
Brno University of Technology
- Responsible person Doc. RNDr. Miloslav Ohlídal, CSc.
- Responsible person Mgr. Petr Klapetek, Ph.D.
- Responsible person Ing. Svatopluk Bajer
The topic of the project is the development of the technology of protective films formation by means of plasma enhanced chemical vapor deposition (PECVD) for plastic lenses of headlamps and for surfaces of automobile reflectors.
Publications
Total number of publications: 9
2012
-
MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD
Chem. Listy, year: 2012, volume: 106/2012, edition: 106
-
PROPERTIES OF MODIFIED AMORPHOUS CARBON THIN FILMS DEPOSITED BY PECVD
Chem. listy, year: 2012, volume: 106/2012, edition: 106
2011
-
Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
-
Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
Thin Solid Films, year: 2011, volume: 519, edition: 13, DOI
-
Ellipsometric characterisation of thin films non-uniform in thickness
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
-
Measurement of the thickness distribution and optical constants of non-uniform thin films
Measurement Science and Technology, year: 2011, volume: 22, edition: 8, DOI
-
Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
-
Variable-angle spectroscopic ellipsometry of considerably non-uniform thin films
Journal of Optics, year: 2011, volume: 13, edition: 8, DOI
2010
-
Band structure of diamond-like carbon films assessed from optical measurements in wide spectral range
Diamond and Related Materials, year: 2010, volume: 19, edition: 2-3