Project information
The morfology of the interfaces in heteroepitaxial multilayers

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Project Identification
Project Period
1/1997 - 1/1999
Investor / Pogramme / Project type
Czech Science Foundation
MU Faculty or unit
Faculty of Science
Cooperating Organization
Institute of Physics of the ASCR, v. v. i.

The morphology of the interfaces in epitaxial multilayers is decisive for their optical and electrical peformance. The interfaces in multilayers of the type III-V and SiGe/Si multilayers grown by MBE and MOVPE methods will be studied within the project. High-resolution x-ray diffractometry and x-ray reflectometry will be used both in the specular and in the non-specular regimes. The results will be compared with the observations of the interfaces by local techniques (tunneling microscopy, TEM) and by op


Total number of publications: 4

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