Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content

• Authors: HOLÝ Václav
• Year of publication: 1995
• Type: Article in Periodical
• Magazine / Source: J. Appl. Phys.
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism

Related projects

• Physical properties of new materials and layered structures