Publication details
Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie
| Title in English | Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry |
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| Authors | |
| Year of publication | 1999 |
| Type | Article in Periodical |
| Magazine / Source | Jemná mechanika a optika |
| MU Faculty or unit | |
| Citation | |
| Field | Optics, masers and lasers |
| Description | In this paper the ellipsometric method enabling us to determine the values of all the optical parameters, ie. the values of the refractive indices and thicknesses, of non-absorbing double layers and triple layers placed onto absorbing substrate is described. |
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