Project information

Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods

Investor logo
Project Identification
Project Period
1/1998 - 1/2000
Investor / Pogramme / Project type
Czech Science Foundation
MU Faculty or unit
Faculty of Science
Cooperating Organization
Institute of Scientific Instruments of the ASCR, v. v. i.
Brno University of Technology

Within both perturbation and diffraction theories new theoretical approaches enabling us to express optical quantities of multilayer systems with randomly rough boundaries will be formulated. These quantities will be connected with coherently and incoher ently scattered light. The theoretical results will be compared with experimental results achieved for chosen rough multilayer systems. Analytical methods allowing a determination of the optical and statistical parameters of the systems mentioned will be developed. Moreover, a comparison of the new theoretical approach developed within the perturbation theory with approaches employed in the X-ray region will be carried out. Possibilities concerning an extension of this optical approach to the X-ray regi on will also be investigated. A combination of optical and X-ray methods will be used for analyzing various thin film systems.


Total number of publications: 34

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