Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2014
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Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm
Year: 2014
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Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm
Year: 2014
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Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45°
Year: 2014
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Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm
Year: 2014
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Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry
Thin Solid Films, year: 2014, volume: 571, edition: november, DOI
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Broadening of dielectric response and sum rule conservation
Thin Solid Films, year: 2014, volume: 571, edition: November, DOI
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Dispersion model of two-phonon absorption: application to c-Si
OPTICAL MATERIALS EXPRESS, year: 2014, volume: 4, edition: 8, DOI
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Improved combination of scalar diffraction theory and Rayleigh-Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
Thin Solid Films, year: 2014, volume: 571, edition: November, DOI
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Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
Applied Optics, year: 2014, volume: 53, edition: 25, DOI
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Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen
Thin Solid Films, year: 2014, volume: 571, edition: november, DOI