Mgr. Daniel Franta, Ph.D.

Výzkumný pracovník II, Optics for Thin films and Solid surfaces

office: pav. 07/02012
Kotlářská 267/2
611 37 Brno

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phone:	+420 549 49 3836
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Basic information

Type

Total number of publications: 219

2015

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

OHLÍDAL Miloslav OHLÍDAL Ivan NEČAS David VODÁK Jiří FRANTA Daniel NÁDASKÝ Pavel VIŽĎA František

Article in Proceedings

Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015
Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry

NEČAS David OHLÍDAL Ivan VODÁK Jiří OHLÍDAL Miloslav FRANTA Daniel

Article in Proceedings

Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015
Universal dispersion model for characterization of optical thin films over wide spectral range: Application to hafnia

FRANTA Daniel NEČAS David OHLÍDAL Ivan

Article in Periodical

Applied Optics, year: 2015, volume: 54, edition: 31, DOI
Wide spectral range characterization of antireflective coatings and their optimization

FRANTA Daniel NEČAS David OHLÍDAL Ivan JANKUJ Jiří

Article in Proceedings

Conference on Optical Systems Design - Optical Fabrication, Testing, and Metrology V, year: 2015

2014

Antireflexní vrstva (Al2O3/MgF2) pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm

BŘEZINA Jaromír FRANTA Daniel

Outcomes put into operation (prototype, working sample)

Year: 2014
Antireflexní vrstva (SiO2/Al2O3/MgF2) pro dalekou ultrafialovou (FUV, VUV) oblast spektra na vlnové délce 193nm

BŘEZINA Jaromír FRANTA Daniel

Outcomes put into operation (prototype, working sample)

Year: 2014
Antireflexní vrstva z materiálů Al2O3/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm pro úhel dopadu 45°

BŘEZINA Jaromír FRANTA Daniel

Outcomes put into operation (prototype, working sample)

Year: 2014
Antireflexní vrstva z materiálů HfO2/SiO2 pro hlubokou ultrafialovou (DUV) oblast spektra na vlnové délce 266nm

BŘEZINA Jaromír FRANTA Daniel

Outcomes put into operation (prototype, working sample)

Year: 2014
Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

NEČAS David OHLÍDAL Ivan FRANTA Daniel ČUDEK Vladimír OHLÍDAL Miloslav VODÁK Jiří SLÁDKOVÁ Lucia ZAJÍČKOVÁ Lenka ELIÁŠ Marek VIZĎA František

Article in Periodical

Thin Solid Films, year: 2014, volume: 571, edition: november, DOI
Broadening of dielectric response and sum rule conservation

FRANTA Daniel NEČAS David ZAJÍČKOVÁ Lenka OHLÍDAL Ivan

Article in Periodical

Thin Solid Films, year: 2014, volume: 571, edition: November, DOI