Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2013
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Advanced modeling for optical characterization of amorphous hydrogenated silicon films
Thin Solid Films, year: 2013, volume: 541, edition: Aug, DOI
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Application of sum rule to the dispersion model of hydrogenated amorphous silicon
Thin Solid Films, year: 2013, volume: 539, edition: Jul, DOI
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Application of Thomas-Reiche-Kuhn sum rule to construction of advanced dispersion models
Thin Solid Films, year: 2013, volume: 534, edition: May, DOI
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Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride films
Surface and Interface Analysis, year: 2013, volume: 45, edition: 7, DOI
2012
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Method of realisation of polyreactions, plasma-chemical polyreactions, their modification and modification of macromolecular substances by the plasma jet with a dielectric capillary enlaced by a hollow cathode
Publisher: Evropský patentový úřad, state: Netherlands, patent's number: EP2009029, year: 2012
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MULTIFUNCTIONAL TRANSPARENT PROTECTIVE COATINGS ON POLYCARBONATES PREPARED USING PECVD
Chem. Listy, year: 2012, volume: 106/2012, edition: 106
2011
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Anisotropy-enhanced depolarization on transparent film/substrate system
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Combination of Synchrotron Ellipsometry and Table-Top Optical Measurements for Determination of Band Structure of DLC Films
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI
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Dielectric response and structure of amorphous hydrogenated carbon films with nitrogen admixture
Thin Solid Films, year: 2011, volume: 519, edition: 13, DOI
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Ellipsometric characterisation of thin films non-uniform in thickness
Thin Solid Films, year: 2011, volume: 519, edition: 9, DOI