Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
| phone: | +420 549 49 3836 |
|---|---|
| e‑mail: |
| social and academic networks: |
|---|
Total number of publications: 219
2018
-
Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers
Surface and Interface Analysis, year: 2018, volume: 50, edition: 11, DOI
-
Ellipsometry of Layered Systems
Optical Characterization of Thin Solid Films, year: 2018, number of pages: 35 s.
-
Measurement of doping profiles by a contactless method of IR reflectance under grazing incidence
Review of Scientific Instruments, year: 2018, volume: 89, edition: 6, DOI
-
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
Journal of modern optics, year: 2018, volume: 65, edition: 14, DOI
-
Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range
Optical Characterization of Thin Solid Films, year: 2018, number of pages: 52 s.
-
Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
Surface and Interface Analysis, year: 2018, volume: 50, edition: 7, DOI
2017
-
Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model
Thin Solid Films, year: 2017, volume: 631, edition: June, DOI
-
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI
-
Hafnium oxide thin films as a barrier against copper diffusion in solar absorbers
Solar Energy Materials and Solar Cells, year: 2017, volume: 166, edition: July, DOI
-
Optical characterization of hafnia films deposited by ALD on copper cold-rolled sheets by difference ellipsometry
Applied Surface Science, year: 2017, volume: 421, edition: November, DOI