prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2005
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Characterization of optical thin films exhibiting defects
Advances in Optical Thin Films II, year: 2005
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Influence of technological conditions on mechanical stresses inside diamond-like carbon films
Diamond and Related Materials, year: 2005, volume: 14, edition: 11-12
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Měření mechanického napětí v tenkých vrstvách pomocí kombinované optické metody
Jemná mechanika a optika, year: 2005, volume: 50, edition: 3
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Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly
Kvalita a GPS 2005, year: 2005
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Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
Journal of Modern Optics, year: 2005, volume: 52, edition: 4
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Optical characterization of non-uniform thin films using imaging spectrophotometry
Advances in Optical Thin Films II, year: 2005
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Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions
Applied Surface Science, year: 2005, volume: 244, edition: 1-4
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Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry
Vacuum, year: 2005, volume: 80, edition: 1-3
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Optical measurement of mechanical stresses in diamond-like carbon films
8-th International Symposium on Laser Metrology, year: 2005
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Optical properties of NiO thin films prepared by pulsed laser deposition technique
Applied Surface Science, year: 2005, volume: 244, edition: 1-4