Mgr. Mojmír Meduňa, Ph.D.
Assistant professor, Department of Condensed Matter Physics
Office: pav. 09/01027
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6061 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 73
2005
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Intersubband absorption of strain compensated, Si1-xGex valenceband quantum wells with 0.7<=x<=0.85
J. Appl. Phys., year: 2005, volume: 98, edition: 4
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Structural studies of strain-symmetrised Si/SiGe structures grown by molecular beam epitaxy
Journal of crystal growth, year: 2005, volume: 278, edition: 1-4
2004
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Annealing studies of high Ge composition Si/SiGe multilayers
Zeitschrift fur Kristalographie, year: 2004, volume: 219, edition: 4
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X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices
Journal of Applied Physics, year: 2004, volume: 96, edition: 9
2002
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Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Semicond. Sci. Technol., year: 2002, volume: 17, edition: 1
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Investigation of morphology and chemical composition of self-organized semiconductor quantum dots and wires by X-ray scattering
Acta Physica Polonica, year: 2002, volume: A102, edition: 3
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Lateral composition modulation in (InAs)(n)/(AlAs)(m) short-period superlattices investigated by high-resolution x-ray scattering
Physical Review B, year: 2002, volume: 66, edition: 8
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Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Physica E, year: 2002, volume: 13, edition: 4
2001
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Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies
Journal of Applied Physics, year: 2001, volume: 91, edition: 11
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X-ray reflectivity from self-assembled structures in Ge/Si superlattices
J. Phys.D.: Appl. Phys., year: 2001, volume: 34, edition: 10A