Mgr. Mojmír Meduňa, Ph.D.
Assistant professor, Department of Condensed Matter Physics
Office: pav. 09/01027
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6061 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 73
2011
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Oxygen precipitation studied by x-ray diffraction techniques
Solid State Phenomena, year: 2011, volume: Neuveden, edition: 178-179
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Performance of multilayer monochromators for hard X-ray imaging with coherent synchrotron radiation
THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, year: 2011
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Study of oxide precipitates in silicon using X-ray diffraction techniques
physica status solidi (a), Applied research, year: 2011, volume: 208, edition: 11, DOI
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X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON
Materials Structure in Chemistry, Biology, Physics and Technology, year: 2011, volume: 18, edition: 3
2010
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Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging
Journal of Synchrotron Radiation, year: 2010, volume: 17, edition: 4
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Defect Engineering in Czochralski-grown Silicon Studied by TEM
Year: 2010, type: Conference abstract
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Micro-imaging performance of multilayers used as monochromators for coherent hard X-ray synchrotron radiation
Proceedings of SPIE - The International Society for Optical Engineering, year: 2010, volume: Neuveden, edition: 7802, DOI
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Oxygen Precipitation in CZ Si Wafers after High Temperature Pre-annealing
Year: 2010, type: Conference abstract
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X-ray scattering study of oxide precipitates in Cz-Si
Year: 2010, type: Conference abstract
2009
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Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealing
J.Phys.: Condens. Matter, year: 2009, volume: 21, edition: 10