Project information
Project information
Vývoj metod pro charakterizaci defektů na površích pevných látek
- Project Identification
- FT-TA/094
- Project Period
- 5/2004 - 12/2007
- Investor / Pogramme / Project type
-
Ministry of Industry and Trade of the CR
- TANDEM
- MU Faculty or unit
- Faculty of Science
Publications
Total number of publications: 7
2006
-
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy
Surface and Interface Analysis, year: 2006, volume: 38, edition: 4
-
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces
Journal of Optics A: Pure and Applied Optics, year: 2006, volume: 8, edition: 9
2005
-
Application of the wavelet transformation in AFM data analysis
Acta Physica Slovaca, year: 2005, volume: 55, edition: 3
-
Combination of optical methods and atomic force microscopy at characterization of thin film systems
Acta physica slovaca, year: 2005, volume: 55, edition: 3
-
Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces
Optics Communications, year: 2005, volume: 248, edition: 1
-
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly
Kvalita a GPS 2005, year: 2005
-
Scanning thermal microscopy - theory and applications
Jemná mechanika a optika, year: 2005, volume: 50, edition: 11-12