Publication details
Investigation of strain relaxation of Ge 1-x Si x epilayers on Ge (001) by high-resolution x-ray reciprocal space mapping
| Authors | |
|---|---|
| Year of publication | 1995 |
| Type | Peer-reviewed scientific article |
| Magazine / Source | Semicond. Sci. Technol. |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Related projects: |