Publication details
Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods
| Authors | |
|---|---|
| Year of publication | 2006 |
| Type | Article in Periodical |
| Magazine / Source | Journal of Applied Crystallography |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods |
| Description | Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods |