Mgr. Daniel Franta, Ph.D.

1999

• Comparison of optical and non-optical methods for measuring surface roughness

  OHLÍDAL Ivan OHLÍDAL Miloslav FRANTA Daniel TYKAL Miroslav

  Article in Proceedings

  Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 1999

• Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy

  OHLÍDAL Ivan FRANTA Daniel PINČÍK Emil OHLÍDAL Miloslav

  Article in Periodical

  Surface and Interface Analysis, year: 1999, volume: 28, edition: 1

• Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering

  OHLÍDAL Miloslav UNČOVSKÝ Marek OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Journal of modern optics, year: 1999, volume: 46, edition: 2

• Characterisation of DLC Films Prepared by PECVD

  FRANTA Daniel ZAJÍČKOVÁ Lenka

  Article in Proceedings

  Proceedings of 12th Symposium on Application of Plasma Processes, year: 1999

• Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness

  OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr VIČAR Martin

  Article in Periodical

  Jemná mechanika a optika, year: 1999, volume: 44, edition: 10

• The influence of substrate emissivity on plasma enhanced CVD of diamond-like carbon films

  ZAJÍČKOVÁ Lenka BURŠÍKOVÁ Vilma FRANTA Daniel

  Article in Periodical

  Czechoslovak Journal of Physics, year: 1999, volume: 49, edition: 8

1998

• Analysis of thin films with slightly rough boundaries

  OHLÍDAL Ivan FRANTA Daniel HORA Jaroslav NAVRÁTIL Karel WEBER Jan JANDA Pavel

  Article in Periodical

  Mikrochim. Acta, year: 1998, volume: Suppl. 15, edition: 1

• Comparison of AFM and optical methods at measuring nanometric surface roughness

  OHLÍDAL Ivan FRANTA Daniel OHLÍDAL Miloslav VIČAR Martin KLAPETEK Petr

  Article in Proceedings

  Proceedings of the 3th Seminar on Quantitative Microscopy, year: 1998

• Ellipsometric parameters and reflectances of thin films with slightly rough boundaries

  FRANTA Daniel OHLÍDAL Ivan

  Article in Periodical

  Journal of modern optics, year: 1998, volume: 45, edition: 5

• Ellipsometry of thin films

  OHLÍDAL Ivan FRANTA Daniel

  Article in Periodical

  Acta Physica Slovaca, year: 1998, volume: 48, edition: 4