Mgr. Daniel Franta, Ph.D.
Výzkumný pracovník II, Optics for Thin films and Solid surfaces
Office: pav. 07/02012
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 3836 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 215
2001
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Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances
Vacuum, year: 2001, volume: 61, edition: 1
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Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly
Československý časopis pro fyziku, year: 2001, volume: 51, edition: 1
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Optical Characterization of Diamond-like Carbon Films
Vacuum, year: 2001, volume: 61, edition: 2-4
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Optical characterization of DLC:Si films prepared by PECVD
Proceedings of 13th Symposium on Application of Plasma Processes, year: 2001
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Optical Characterization of Chalcogenide Thin Films
Applied Surface Science, year: 2001, volume: 175-176, edition: 1
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Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances
Applied Optics, year: 2001, volume: 40, edition: 31
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Study of Thin Film Defects by Atomic Force Microscopy
Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods, year: 2001
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Vliv diskrétní Fourierovy transformace na zpracování AFM dat
Československý časopis pro fyziku, year: 2001, volume: 51, edition: 1
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XPS and Ellipsometric Study of DLC/Silicon Interface
Vacuum, year: 2001, volume: 61, edition: 2-4
2000
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Analysis of Slightly Rough Thin Films by Optical Methods and AFM
Mikrochim. Acta, year: 2000, volume: 132, edition: 1