Mgr. Daniel Franta, Ph.D.

2002

• Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method

  OHLÍDAL Miloslav OHLÍDAL Ivan FRANTA Daniel KRÁLÍK Tomáš JÁKL Miloš ELIÁŠ Marek

  Article in Periodical

  Surface and Interface Analysis, year: 2002, volume: 34, edition: 1

2001

• Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr POKORNÝ Pavel OHLÍDAL Miloslav

  Article in Periodical

  Surface and Interface Analysis, year: 2001, volume: 32, edition: 1

• Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation

  FRANTA Daniel OHLÍDAL Ivan

  Article in Proceedings

  12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 2001

• Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method

  OHLÍDAL Ivan FRANTA Daniel FRUMAR Miroslav JEDELSKÝ Jaroslav NAVRÁTIL Karel

  Article in Periodical

  Journal of Optoelectronics and Advanced Materials, year: 2001, volume: 3, edition: 4

• Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances

  OHLÍDAL Ivan FRANTA Daniel OHLÍDAL Miloslav NAVRÁTIL Karel

  Article in Periodical

  Vacuum, year: 2001, volume: 61, edition: 1

• Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly

  OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

  Article in Periodical

  Československý časopis pro fyziku, year: 2001, volume: 51, edition: 1

• Optical Characterization of Diamond-like Carbon Films

  FRANTA Daniel ZAJÍČKOVÁ Lenka OHLÍDAL Ivan JANČA Jan

  Article in Periodical

  Vacuum, year: 2001, volume: 61, edition: 2-4

• Optical characterization of DLC:Si films prepared by PECVD

  FRANTA Daniel BURŠÍKOVÁ Vilma ZAJÍČKOVÁ Lenka

  Article in Proceedings

  Proceedings of 13th Symposium on Application of Plasma Processes, year: 2001

• Optical Characterization of Chalcogenide Thin Films

  FRANTA Daniel OHLÍDAL Ivan FRUMAR Miloslav JEDELSKÝ Jaroslav

  Article in Periodical

  Applied Surface Science, year: 2001, volume: 175-176, edition: 1

• Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances

  OHLÍDAL Ivan FRANTA Daniel OHLÍDAL Miloslav NAVRÁTIL Karel

  Article in Periodical

  Applied Optics, year: 2001, volume: 40, edition: 31