prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
1997
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Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy
ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis, year: 1997
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Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry
Jemná mechanika a optika, year: 1997, volume: 42, edition: 3
1996
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Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces
Specification, Production, and Testing of Optical Components and Systems, year: 1996
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New Technique of Measurement of Optical Parameters of thin Films
Thin Solid Films, year: 1996, volume: 279
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Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses
Thin Solid Films, year: 1996, volume: 1996, edition: 280
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Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers
ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis, year: 1996
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Spektroskopická elipsometrie slabě drsných povrchů
12. konference českých a slovenských fyziků, year: 1996
1995
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A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids
Pure Appl. Opt., year: 1995, volume: 4, edition: 5
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Interferometry of Randomly Rough Surfaces
Photonics '95, year: 1995
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Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries
Optical Engineering, year: 1995, volume: 34, edition: 6