prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
2000
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Optical characterization of thin films with randomly rough boundaries using the photovoltage method
Thin Solid Films, year: 2000, volume: 366, edition: 1
1999
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Comparison of optical and non-optical methods for measuring surface roughness
Proceedings of SPIE 3820, 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 1999
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Complete Optical Characterization of the SiO2/Si System by Spectroscopic Ellipsometry Spectroscopic Reflectometry and Atomic Force Microscopy
Surface and Interface Analysis, year: 1999, volume: 28, edition: 1
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Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering
Journal of modern optics, year: 1999, volume: 46, edition: 2
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Měření drsnosti povrchu ve strojírenství vybranými metodami koherenční optiky
Jemná mechanika a optika, year: 1999, volume: 44, edition: 9
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New Ways od Observing Optical Inhomogeneities in Glass
Proceedings of the 5th ESG Conference: Glass Science and Technology for the 21st Century, year: 1999
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Optical characterization of multilayer systems with randomly rough boundaries
18th Congress of the International Commision for Optics: Optics for the Next Millennium, year: 1999
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Optical methods for surface characterization
11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, year: 1999
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Optical quantities of multilayer systems with correlated randomly rough boundaries
Journal of modern optics, year: 1999, volume: 46, edition: 14
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Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness
Jemná mechanika a optika, year: 1999, volume: 44, edition: 10