prof. RNDr. Ivan Ohlídal, DrSc.
Head, Optics for Thin films and Solid surfaces
Office: pav. 06/01031
Kotlářská 267/2
611 37 Brno
Phone: | +420 549 49 6244 |
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E‑mail: |
social and academic networks: |
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Total number of publications: 199
1999
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Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie
Jemná mechanika a optika, year: 1999, volume: 1999, edition: 2
1998
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Analysis of thin films with slightly rough boundaries
Mikrochim. Acta, year: 1998, volume: Suppl. 15, edition: 1
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Comparison of AFM and optical methods at measuring nanometric surface roughness
Proceedings of the 3th Seminar on Quantitative Microscopy, year: 1998
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Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
Journal of modern optics, year: 1998, volume: 45, edition: 5
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Ellipsometry of thin films
Acta Physica Slovaca, year: 1998, volume: 48, edition: 4
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Optical parameter analysis of thin absorbing films measured by the photovoltage method
Acta physica polonica A, year: 1998, volume: 94, edition: 3
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Rubidium Bromide (RbBr)
Handbook of Optical Constants of Solids III, year: 1998, number of pages: 11 s.
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Rubidium lodide (RbI)
Handbook of Optical Constants of Solids III, year: 1998, number of pages: 14 s.
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Srovnání výsledků měření drsnosti povrchu dosažených vybranými optickými metodami a metodou profilometrickou
Jemná mechanika a optika, year: 1998, volume: 43, edition: 4
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Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
Optics Communications, year: 1998, volume: 147, edition: 1