Publication details
Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging
| Authors | |
|---|---|
| Year of publication | 2010 |
| Type | Article in Periodical |
| Magazine / Source | Journal of Synchrotron Radiation |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | multilayer mirrors; X-rays; X-ray optics; coherence; X-ray monochromators; X-ray imaging; X-ray phase contrast |
| Description | A systematic study is presented in which multilayers of different composition (W/Si, Mo/Si, Pd/B4C), periodicity (from 2.5 to 5.5 nm) and number of layers have been characterized. In particular, the intrinsic quality (roughness and reflectivity) as well as the performance (homogeneity and coherence of the outgoing beam) as a monochromator for synchrotron radiation hard X-ray micro-imaging are investigated. The results indicate that the material composition is the dominating factor for the performance. |
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