Informace o publikaci
Optical properties of thin films of poly(methyl-phenylsilylene)
| Autoři | |
|---|---|
| Rok publikování | 1999 |
| Druh | Článek v odborném periodiku |
| Časopis / Zdroj | Optical Materials |
| Fakulta / Pracoviště MU | |
| Citace | |
| Obor | Fyzika pevných látek a magnetismus |
| Popis | We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV. |
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